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MB2374 Datasheet, PDF (7/12 Pages) NXP Semiconductors – Dual octal D-type flip-flop; positive-edge trigger (3-State)
Philips Semiconductors
16-bit D-type flip-flop; positive-edge trigger (3-State)
Product specification
MB2374
TEST CIRCUIT AND WAVEFORM
VCC
VIN
VOUT
RL
PULSE
GENERATOR
D.U.T.
RT
CL
RL
Test Circuit for 3-State Outputs
SWITCH POSITION
TEST
SWITCH
tPLZ
tPZL
All other
closed
closed
open
7.0V
90%
NEGATIVE
PULSE
POSITIVE
PULSE
10%
tW
VM
10%
VM
10%
tTHL (tF)
tTLH (tR)
90%
VM
90%
VM
tW
VM = 1.5V
Input Pulse Definition
90%
AMP (V)
0V
tTLH (tR)
tTHL (tF)
AMP (V)
10%
0V
DEFINITIONS
RL = Load resistor; see AC CHARACTERISTICS for value.
CL =
Load capacitance includes jig and probe capacitance; see AC
CHARACTERISTICS for value.
RT = Termination resistance should be equal to ZOUT of pulse generators.
FAMILY
MB
Amplitude
3.0V
INPUT PULSE REQUIREMENTS
Rep. Rate
tW
tR
tF
1MHz
500ns 2.5ns 2.5ns
SB00010
1993 Aug 23
7