74HC2G126 Datasheet, PDF (7/20 Pages) NXP Semiconductors – Dual buffer/line driver; 3-state

Philips Semiconductors
Dual buffer/line driver; 3-state
Product specification
74HC2G126; 74HCT2G126
SYMBOL
PARAMETER
TEST CONDITIONS
OTHER
V_CC (V)
T_amb = −40 to +125 °C
V_IH
HIGH-level input voltage
2.0
4.5
6.0
V_IL
LOW-level input voltage
2.0
4.5
6.0
V_OH
HIGH-level output voltage V_I = V_IH or V_IL
I_O = −20 µA
2.0
I_O = −20 µA
4.5
I_O = −20 µA
6.0
I_O = −6.0 mA
4.5
I_O = −7.8 mA
6.0
V_OL
LOW-level output voltage V_I = V_IH or V_IL
I_O = 20 µA
2.0
I_O = 20 µA
4.5
I_O = 20 µA
6.0
I_O = 6.0 mA
4.5
I_O = 7.8 mA
6.0
I_LI
input leakage current
V_I = V_CC or GND
6.0
I_OZ
3-state output OFF current V_I = V_IH or V_IL;
6.0
V_O = V_CC or GND
I_CC
quiescent supply current V_I = V_CC or GND;
6.0
I_O = 0
Note
1. All typical values are measured at T_amb = 25°C.
MIN.
1.5
3.15
4.2
−
−
−
1.9
4.4
5.9
3.7
5.2
−
−
−
−
−
−
−
−
TYP.⁽¹⁾ MAX. UNIT
−
−
V
−
−
V
−
−
V
−
0.5
V
−
1.35 V
−
1.8
V
−
−
V
−
−
V
−
−
V
−
−
V
−
−
V
−
0.1
V
−
0.1
V
−
0.1
V
−
0.4
V
−
0.4
V
−
±1.0
µA
−
±10.4 µA
−
20
µA
2003 Mar 03
7