74HC2G02 Datasheet, PDF (7/16 Pages) NXP Semiconductors – Dual 2-input NOR gate

Philips Semiconductors
Dual 2-input NOR gate
Product specification
74HC2G02; 74HCT2G02
SYMBOL
PARAMETER
TEST CONDITIONS
OTHER
V_CC (V)
MIN.
T_amb = −40 to +125 °C
V_IH
HIGH-level input voltage
2.0
1.5
4.5
3.15
6.0
4.2
V_IL
LOW-level input voltage
2.0
−
4.5
−
6.0
−
V_OH
HIGH-level output voltage V_I = V_IH or V_IL
I_O = −20 µA
2.0
1.9
I_O = −20 µA
4.5
4.4
I_O = −20 µA
6.0
5.9
I_O = −4.0 mA
4.5
3.7
I_O = −5.2 mA
6.0
5.2
V_OL
LOW-level output voltage V_I = V_IH or V_IL
I_O = 20 µA
2.0
−
I_O = 20 µA
4.5
−
I_O = 20 µA
6.0
−
I_O = 4.0 mA
4.5
−
I_O = 5.2 mA
6.0
−
I_LI
input leakage current
V_I = V_CC or GND
6.0
−
I_CC
quiescent supply current V_I = V_CC or GND; I_O = 0 6.0
−
Note
1. All typical values are measured at T_amb = 25 °C.
TYP.
−
−
−
−
−
−
−
−
−
−
−
−
−
−
−
−
−
−
MAX. UNIT
−
V
−
V
−
V
0.5
V
1.35 V
1.8
V
−
V
−
V
−
V
−
V
−
V
0.1
V
0.1
V
0.1
V
0.4
V
0.4
V
±1.0
µA
20
µA
2003 May 14
7