74F776 Datasheet, PDF (7/12 Pages) NXP Semiconductors – Pi-bus transceiver

Philips Semiconductors
Pi–bus transceiver
Product specification
74F776
DC ELECTRICAL CHARACTERISTICS
(Over recommended operating free-air temperature range unless otherwise noted.)
SYMBOL
PARAMETER
TEST
CONDITIONS¹
LIMITS
UNIT
MIN TYP² MAX
I_OH
High–level output current
I_OFF
Power–off output current
V_OH
High-level output voltage
V_OL
Low-level output voltage
V_IK
Input clamp voltage
I_I
Input current at
maximum input voltage
I_IH
High–level input current
I_IL
Low–level input current
I_OZH + I_IH
Off state output current,
high level voltage applied
B0 – B7
B0 – B7
A0 – A7⁴
A0 – A7⁴
B0 – B7
A0 – A7
Except A0 – A7
OEBn, OEA, LE
A0 – A7, B0 – B7
OEBn, OEA, LE
B0 – B7
OEBn, OEA, LE
B0 – B7
V_CC = MAX, V_IL = MAX, V_IH = MIN, V_OH = 2.1V
V_CC = 0.0V, V_IL = MAX, V_IH = MIN, V_OH = 2.1V
V_CC = MIN,
I_OH = –3mA, V_X =V_CC
V_IL = MAX, V_IH = MIN
I_OH = –4mA,
V_X =3.13V and 3.47V
V_CC = MIN,
I_OL = 20mA, V_X = V_CC
V_IL = MAX
I_OL = 100mA
V_IH = MIN
I_OL = 4mA
V_CC = MIN, I_I = I_IK
V_CC = MIN, I_I = I_IK
V_CC = 0.0V, V_I = 7.0V
V_CC = MAX, V_I = 5.5V
V_CC = MAX, V_I = 2.7V, Bn –An =0V
V_CC = MAX, V_I = 2.1V
V_CC = MAX, V_I = 0.5V
V_CC = MAX, V_I = 0.3V
A0 – A7
V_CC = MAX, V_O = 2.7V
2.5
2.5
0.40
100 µA
100 µA
V_CC
V
V
0.50 V
1.15 V
V
-0.5 V
-1.2 V
100 µA
1
mA
20 µA
100 µA
–20 µA
–100 µA
70 ^µA
I_OZL + I_IL
Off state output current,
low level voltage applied
A0 – A7
V_CC = MAX, V_O = 0.5V
–70 ^µA
I_X
High–level control current
V_CC = MAX, V_X = V_CC, LE = OEA = OEBn =
2.7V, A0 – A7 = 2.7V, B0 – B7 = 2.0V,
V_CC = MAX, V_X = 3.13 & 3.47V, LE = OEA =
2.7V, OEBn = A0 – A7 = 2.7V, B0 – B7 = 2.0V,
–100
–10
100 µA
10 µA
I_OS
Short circuit output
current³
A0 – A7 only
V_CC = MAX, Bn = 1.8V, OEA = 2.0V,
OEBn = 2.7V
-60
-150 mA
I_CCH
V_CC = MAX
65 100 mA
I_CC
Supply current (total)
I_CCL
V_CC = MAX, V_IL = 0.5V
100 145 mA
I_CCZ
75 100 mA
Notes to DC electrical characteristics
1. For conditions shown as MIN or MAX, use the appropriate value specified under recommended operating conditions for the applicable type.
Unless otherwise specified, V_X = V_CC for all test conditions.
2. All typical values are at V_CC = 5V, T_amb = 25°C.
3. Not more than one output should be shorted at a time. For testing I_OS, the use of high-speed test apparatus and/or sample-and-hold
techniques are preferable in order to minimize internal heating and more accurately reflect operational values. Otherwise, prolonged shorting
of a high output may raise the chip temperature well above normal and thereby cause invalid readings in other parameter tests. In any
sequence of parameter tests, I_OS tests should be performed last.
4. Due to test equipment limitations, actual test conditions are for V_IH =1.8v and V_IL = 1.3V.
December 19, 1990
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