74F711A Datasheet, PDF (7/16 Pages) NXP Semiconductors – consist of five 2-to-1 multiplexers designedfor address multiplexing of dynamic RAMs and other multiplexing applicationThe outputs source 15mA

Philips Semiconductors
Multiplexers
Product specification
74F711A/74F711–1/
74F712A/74F712–1
DC ELECTRICAL CHARACTERISTICS
(Over recommended operating free-air temperature range unless otherwise noted.)
SYMBOL
PARAMETER
TEST CONDITIONS¹
LIMITS
MIN TYP² MAX
UNIT
V_OH
High-level output voltage
V_CC = MIN,
V_IL = MAX,
V_IH = MIN
I_OH = –3mA
I_OH = –15mA
±10%V_CC
±5%V_CC
±10%V_CC
±5%V_CC
2.4
2.7
2.0
2.0
3.4
V
V
V
V
74F711A/
±10%V_CC
V_OL
74F712A
Low-level output voltage ^only
V_CC = MIN,
V_IL = MAX,
I_OL = MAX
±5%V_CC
74F711-1/
74F712-1
V_IH = MIN
I_OL = 5mA
±10%V_CC
0.38 0.55
V
0.42 0.55
V
0.38 0.50
V
V_IK
Input clamp voltage
I_I
Input current at maximum input
voltage
V_CC = MIN, I_I = I_IK
V_CC = MAX, V_I = 7.0V
–0.73 –1.2
V
100
µA
I_IH
High-level input current
Others
I_IL
Low-level input current
Dn only
V_CC = MAX, V_I = 2.7V
V_CC = MAX, V_I = 0.5V
20
µA
–20
µA
–40
µA
I_OZH
I_OZL
Off-state output current
High-level voltage
applied
Off-state output current
Low-level voltage
applied
74F711A/
74F711-1
only
V_CC = MAX, V_O = 2.7V
V_CC = MAX, V_O = 0.5V
50
µA
–50
µA
I_OS
Short-circuit output
current³
74F711-1/
74F712-1
V_CC = MAX
–60
–150 mA
I_O
Output current⁴
74F711A/
74F712A
V_CC = MAX, V_O = 2.25 V
–60
–150 mA
I_CCH
25
35
mA
74F711A
I_CCL
V_CC = MAX
33
46
mA
I_CCZ
27
40
mA
I_CCH
I_CC
Supply
current
74F711-1
I_CCL
(total)
I_CCZ
V_CC = MAX
26
40
mA
33
45
mA
28
45
mA
74F712A
I_CCH
I_CCL
V_CC = MAX
20
27
mA
30
40
mA
74F712-1
I_CCH
I_CCL
V_CC = MAX
20
30
mA
29
40
mA
NOTES:
1. For conditions shown as MIN or MAX, use the appropriate value specified under recommended operating conditions for the applicable type.
2. All typical values are at V_CC = 5V, T_amb = 25°C.
3. Not more than one output should be shorted at a time. For testing I_OS, the use of high-speed test apparatus and/or sample-and-hold
techniques are preferable in order to minimize internal heating and more accurately reflect operational values. Otherwise, prolonged shorting
of a High output may raise the chip temperature well above normal and thereby cause invalid readings in other parameter tests. In any
sequence of parameter tests, I_OS tests should be performed last.
4. I_O is tested under conditions that produce current approximity one half of the true short-circuit output current (I_OS).
1990 Dec 13
7