74F646 Datasheet, PDF (7/16 Pages) NXP Semiconductors – Octal transceiver/register, non-inverting 3-State

Philips Semiconductors
Transceivers/registers
Product specification
74F646/A/74F648/A
DC ELECTRICAL CHARACTERISTICS
(Over recommended operating free-air temperature range unless otherwise noted.)
SYMBOL
PARAMETER
TEST
CONDITIONS¹
LIMITS
UNIT
MIN TYP² MAX
V_CC = MIN, I_OH = –3mA ^±10%VCC 2.4
V
V_OH
High-level output voltage
V_IL = MAX,
±5%V_{CC 2.7}
3.4
V
V_IH = MIN
I_OH =
–15mA
±10%V_{CC 2.0}
V
V_OL
Low-level output voltage
V_IK
I_I
I_IH
I_IL
I_OZH + I_IH
Input clamp voltage
Input current at
maximum input voltage
High–level input current
Low–level input current
Off–state output current,
high–level voltage applied
All
74F646/74F648 only
others
A0–A7, B0–B7
OE, DIR, CPAB,
CPBA, SAB, SBA
V_CC = MIN,
V_IL = MAX,
I_OL = 48mA
V_IH = MIN I_OL = 64mA
V_CC = MIN, I_I = I_IK
V_CC = 0.0V, V_I = 7.0V
V_CC = MAX, V_I = 5.5V
V_CC = MAX, V_I = 2.7V
V_CC = MAX, V_I = 0.5V
±10%V_CC
±5%V_CC
A0 – A7, B0 –B7 ^{VCC = MAX, VO = 2.7V}
0.38 0.55 V
0.42 0.55 V
–0.73 -1.2 V
100 µA
1 mA
20 µA
–20 µA
70 ^µA
I_OZL + I_IL
Off–state output current,
low–level voltage applied
V_CC = MAX, V_O = 0.5V
–70 ^µA
I_OS
Short–circuit output current³
74F646, 74F648 V_CC = MAX
-100
-225 mA
I_O
Output current⁴
74F646A, 74F648A V_CC = MAX, V₀ = 2.25V
-60
-150 mA
74F646,
I_CCH
125 165 mA
74F648
I_CCL V_CC = MAX
160 210 mA
I_CC
Supply current (total)
I_CCZ
135 160 mA
74F646A, I_CCH
100 145 mA
74F648A I_CCL V_CC = MAX
110 155 mA
I_CCZ
105 155 mA
NOTES:
1. For conditions shown as MIN or MAX, use the appropriate value specified under recommended operating conditions for the applicable type.
Unless otherwise specified, V_X = V_CC for all test conditions.
2. All typical values are at V_CC = 5V, T_amb = 25°C.
3. Not more than one output should be shorted at a time. For testing I_OS, the use of high-speed test apparatus and/or sample-and-hold
techniques are preferable in order to minimize internal heating and more accurately reflect operational values. Otherwise, prolonged shorting
of a high output may raise the chip temperature well above normal and thereby cause invalid readings in other parameter tests. In any
sequence of parameter tests, I_OS tests should be performed last.
4. I_O is tested under conditions that produce current approximately one half of the true short–circuit output current (I_OS).
1990 Sep 25
7