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BUK7640-100A Datasheet, PDF (6/8 Pages) NXP Semiconductors – TrenchMOS transistor Standard level FET
Philips Semiconductors
TrenchMOS transistor
Standard level FET
Product specification
BUK7640-100A
VGS
0
RGS
L
VDS
T.U.T.
+ VDD
-
-ID/100
R 01
shunt
Fig.17. Avalanche energy test circuit.
WDSS = 0.5 ⋅ LID2 ⋅ BVDSS/(BVDSS − VDD)
100
IAV
25ºC
10
Tj prior to avalanche 150ºC
1
0.001
0.01
0.1
1
10
Avalanche Time, tAV (ms)
Fig.18. Maximum permissible repetitive avalanche
current(IAV) versus avalanche time(tAV) for unclamped
inductive loads.
+ VDD
RD
VDS
-
VGS
0
RG
T.U.T.
Fig.19. Switching test circuit.
December 1999
6
Rev 1.000