74F620 Datasheet, PDF (6/12 Pages) NXP Semiconductors – Octal bus transceiver, inverting 3tate

Philips Semiconductors
Transceivers
Product specification
74F620/74F623
DC ELECTRICAL CHARACTERISTICS
(Over recommended operating free-air temperature range unless otherwise noted.)
SYMBOL
PARAMETER
TEST CONDITIONS^{NO TAG}
LIMITS
MIN
TYP
NO TAG
MAX
UNIT
V_OH
High-level output voltage
A0–A7
B0–B7
V_CC = MIN,
V_IL = MAX,
I_OH = –3mA
±10%V_CC
±5%V_CC
2.4
2.7
3.3
B0–B7
V_IH = MIN
±10%V_CC
I_OH = –15mA _±5%VCC
2.0
2.0
V
V
V
V
±10%V_CC
A0–A7 _{VCC = MIN,} I_OL = 24mA
±5%V_CC
V_OL
Low-level output voltage
B0–B7
V_IL = MAX,
V_IH = MIN,
I_OL = 48mA
±10%V_CC
I_OL = 64mA ±5%V_CC
0.35 0.50
V
0.35 0.50
V
0.38 0.55
V
0.42 0.55
V
V_IK
Input clamp voltage
V_CC = MIN, I_I = I_IK
–0.73 –1.2
V
I_I
Input current at maximum
input voltage
OEBA,
OEAB
V_CC = 0.0V, V_I = 7.0V
others V_CC = 5.5V, V_I = 5.5V
100
µA
1
mA
I_IH
High-level input current
OEBA, V_CC = MAX, V_I = 2.7V
OEAB
I_IL
Low-level input current
only V_CC = MAX, V_I = 0.5V
20
µA
–20
µA
I_OZH+I_IH
I_OZL+I_IL
Off-state output current,
High-level of voltage applied
Off-state output current,
Low-level of voltage applied
A0–A7
B0–B7
V_CC = MAX, V_I = 2.7V
V_CC = MAX, V_I = 0.5V
70
µA
–70
µA
I_OS
Short-circuit output cur-
rent^{NO TAG}
A0–A7
V_CC = MAX
B0–B7
–60
–100
–150
mA
–225
mA
I_CCH
OEBA=OEAB=4.5V;
A0–A7=GND
70
92
mA
74F620
I_CCL
V_CC = MAX
OEBA=OEAB=4.5V;
A0–A7=4.5V
84
110
mA
I_CC
Supply current
(total)
I_CCZ
I_CCH
OEAB=GND;
OEBA=A0–A7=4.5V
OEBA=OEAB=4.5V;
A0–A7=4.5V
84
110
mA
110
140
mA
74F623
I_CCL
V_CC = MAX
OEBA=OEAB=4.5V;
A0–A7=GND
110
140
mA
I_CCZ
OEAB=GND;
OEBA=A0–A7=4.5V
99
130
mA
NOTES:
1. For conditions shown as MIN or MAX, use the appropriate value specified under recommended operating conditions for the applicable type.
2. All typical values are at V_CC = 5V, T_amb = 25°C.
3. Not more than one output should be shorted at a time. For testing I_OS, the use of high-speed test apparatus and/or sample-and-hold
techniques are preferable in order to minimize internal heating and more accurately reflect operational values. Otherwise, prolonged shorting
of a High output may raise the chip temperature well above normal and thereby cause invalid readings in other parameter tests. In any
sequence of parameter tests, I_OS tests should be performed last.
1990 Apr 6
6