74F579 Datasheet, PDF (6/14 Pages) NXP Semiconductors – 8-bit bidirectional binary counter 3-State

Philips Semiconductors
8-bit bidirectional binary counter (3-State)
Product specification
74F579
DC ELECTRICAL CHARACTERISTICS
(Over recommended operating free-air temperature range unless otherwise noted.)
SYMBOL
PARAMETER
TEST CONDITIONS¹
LIMITS
MIN TYP² MAX
UNIT
V_OH
High-level output voltage
TC
V_CC = MIN,
V_IL = MAX,
V_IH = MIN
I_OH = –1mA ^±10%VCC
2.5
±5%V_CC
2.7
3.4
I/O_n
(V_IL = 0.0V,
V_IH = 4.5V
I_OH = –3mA
for MR, CP inputs)
±10%V_CC
±5%V_CC
2.4
2.7
3.3
3.3
V
V
V
V
V_OL
Low-level output voltage
V_CC = MIN,
V_IL = MAX,
V_IH = MIN
I_OL = MAX,
±10%V_CC
±5%V_CC
0.35 0.50
V
0.35 0.50
V
V_IK
I_I
I_IH
I_IL
I_OZH+ I_IH
I_OZL+ I_IL
Input clamp voltage
Input current
at maximum input voltage
High-level input current
Low-level input current
Off-state output current
High-level voltage applied
Off-state output current
Low-level voltage applied
I/O_n
others
except
I/O_n
I/O_n
V_CC = MIN, I_I = I_IK
V_CC = MAX, V_I = 5.5V
V_CC = MAX, V_I = 7.0V
V_CC = MAX, V_I = 2.7V
V_CC = MAX, V_I = 0.5V
V_CC = MAX, V_O = 2.7V
V_CC = MAX, V_O = 0.5V
–0.73 –1.2
V
1
mA
100
µA
20
µA
–0.6
mA
70
µA
–600
µA
I_OS
Short-circuit output current³
V_CC = MAX
–60
–150
mA
I_CCH
95
135
mA
I_CC
Supply current (total)
I_CCL
V_CC = MAX
105
145
mA
I_CCZ
105
150
mA
NOTES:
1. For conditions shown as MIN or MAX, use the appropriate value specified under Recommended Operating Conditions for the applicable
type.
2. All typical values are at V_CC = 5V, T_amb = 25°C.
3. Not more than one output should be shorted at a time. For testing I_OS, the use of high-speed test apparatus and/or sample-and-hold
techniques are preferable in order to minimize internal heating and more accurately reflect operational values. Otherwise, prolonged shorting
of a High output may raise the chip temperature well above normal and thereby cause invalid readings in other parameter tests. In any
sequence of parameter test, I_OS tests should be performed last.
1992 May 04
6