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BUK7613-60E_15 Datasheet, PDF (5/12 Pages) NXP Semiconductors – N-channel TrenchMOS standard level FETll
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NXP Semiconductors
BUK7613-60E
N-channel TrenchMOS standard level FET
6. Characteristics
Table 6. Characteristics
Symbol
Parameter
Conditions
Static characteristics
V(BR)DSS
drain-source
breakdown voltage
ID = 250 µA; VGS = 0 V; Tj = 25 °C
ID = 250 µA; VGS = 0 V; Tj = -55 °C
VGS(th)
gate-source threshold ID = 1 mA; VDS = VGS; Tj = 25 °C;
voltage
Fig. 9; Fig. 10
ID = 1 mA; VDS = VGS; Tj = 175 °C;
Fig. 9
ID = 1 mA; VDS = VGS; Tj = -55 °C;
Fig. 9
IDSS
drain leakage current VDS = 60 V; VGS = 0 V; Tj = 25 °C
VDS = 60 V; VGS = 0 V; Tj = 175 °C
IGSS
gate leakage current VGS = 20 V; VDS = 0 V; Tj = 25 °C
VGS = -20 V; VDS = 0 V; Tj = 25 °C
RDSon
drain-source on-state VGS = 10 V; ID = 15 A; Tj = 25 °C;
resistance
Fig. 11
VGS = 10 V; ID = 15 A; Tj = 175 °C;
Fig. 11; Fig. 12
Dynamic characteristics
QG(tot)
QGS
total gate charge
gate-source charge
ID = 15 A; VDS = 48 V; VGS = 10 V;
Fig. 13; Fig. 14
QGD
gate-drain charge
Ciss
input capacitance
VGS = 0 V; VDS = 25 V; f = 1 MHz;
Coss
output capacitance
Tj = 25 °C; Fig. 15
Crss
reverse transfer
capacitance
td(on)
tr
turn-on delay time
rise time
VDS = 45 V; RL = 3 Ω; VGS = 10 V;
RG(ext) = 5 Ω
td(off)
turn-off delay time
tf
fall time
LD
internal drain
from upper edge of mounting base to
inductance
centre of die
LS
internal source
measured from source lead to source
inductance
bond pad
Min Typ Max Unit
60
-
-
V
54
-
-
V
2.4 3
4
V
1
-
-
V
-
-
4.5 V
-
0.025 1
µA
-
-
500 µA
-
2
100 nA
-
2
100 nA
-
9.44 13
mΩ
-
-
28.2 mΩ
-
22.9 -
nC
-
5
-
nC
-
6.9 -
nC
-
1298 1730 pF
-
197 237 pF
-
122 162 pF
-
10.8 -
ns
-
9.2 -
ns
-
21.9 -
ns
-
9.8 -
ns
-
2.5 -
nH
-
7.5 -
nH
BUK7613-60E
Product data sheet
All information provided in this document is subject to legal disclaimers.
13 July 2012
© NXP B.V. 2012. All rights reserved
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