74F807 Datasheet, PDF (5/8 Pages) –

Philips Semiconductors FAST Products
Octal shift/count registered transceiver
with adder and parity (3–State)
Product specification
FAST 74F807
RECOMMENDED OPERATING CONDITIONS
SYMBOL
PARAMETER
V_CC
Supply voltage
V_IH
High–level input voltage
V_IL
Low–level input voltage
I_Ik
Input clamp current
I_OH
High–level output current
I_OL
Low–level output current
T_amb
Operating free air temperature
range
LIMITS
MIN
NOM
MAX
UNIT
4.5
5.0
5.5
V
2.0
V
0.8
V
–18
mA
–3
mA
24
mA
0
+70
°C
DC ELECTRICAL CHARACTERISTICS
(Over recommended operating free-air temperature range unless otherwise noted.)
SYMBOL
PARAMETER
TEST
CONDITIONS¹
LIMITS
UNIT
MIN TYP² MAX
V_OH
High-level output voltage
V_OL
Low-level output voltage
V_IK
I_I
I_IH
I_IL
I_OZH + I_IH
Input clamp voltage
Input current at maximum input voltage
High–level input current
Low–level input current
Off–state output current,
high–level voltage applied
V_CC = MIN, V_IL = MAX, ^±10%VCC 2.4
V
V_IH = MIN, I_OH = MAX
±5%V_{CC 2.7 3.4}
V
V_CC = MIN, V_IL = MAX,
V_IH = MIN, I_OL = MAX
±10%V_CC
±5%V_CC
0.35 0.50 V
0.35 0.50 V
V_CC = MIN, I_I = I_IK
V_CC = MAX, V_I = 7.0V
V_CC = MAX, V_I = 2.7V
V_CC = MAX, V_I = 0.5V
–0.73 -1.2 V
100 µA
20 µA
–20 µA
An, Bn ^{VCC = MAX, VO = 2.7V}
50 ^µA
I_OZL + I_IL
I_OS
Off–state output current,
low–level voltage applied
Short–circuit output current³
V_CC = MAX, V_O = 0.5V
V_CC = MAX
–50 ^µA
-60
-150 mA
I_CC
Supply current (total)
V_CC = MAX
155 210 mA
Notes to DC electrical characteristics
1. For conditions shown as MIN or MAX, use the appropriate value specified under recommended operating conditions for the applicable type.
2. All typical values are at V_CC = 5V, T_amb = 25°C.
3. Not more than one output should be shorted at a time. For testing I_OS, the use of high-speed test apparatus and/or sample-and-hold
techniques are preferable in order to minimize internal heating and more accurately reflect operational values. Otherwise, prolonged shorting
of a high output may raise the chip temperature well above normal and thereby cause invalid readings in other parameter tests. In any
sequence of parameter tests, I_OS tests should be performed last.
June 18, 1991
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