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SA56614-XX Datasheet, PDF (4/14 Pages) NXP Semiconductors – CMOS system reset
Philips Semiconductors
CMOS system reset
Product data
SA56614-XX
DC ELECTRICAL CHARACTERISTICS
Characteristics measured with Tamb = 25 °C, unless otherwise specified.
SYMBOL
PARAMETER
CONDITIONS
TEST
CIRCUIT
MIN.
TYP.
MAX. UNIT
VS
∆VS
VS/∆T
Reset detection threshold
Hysteresis
Threshold voltage temperature
coefficient
VDD = 0 V → VS + 1.0 V → 0 V
–40 °C ≤ Tamb ≤ +85 °C
1
Fig. 16
VS – 2%
VS
VS + 2%
VS × 0.03 VS × 0.05 VS × 0.08
–
±0.01
–
V
V
%/°C
ICC
Supply current
IOH
IDS leakage current when OFF
VDD = VS + 1.0 V
VDD = VDS = 10 V
–
3
–
Fig. 18
0.25
1.0
µA
–
0.1
µA
INDS1
INDS2
INDS3
IPDS1
IPDS2
IPDS3
N-channel IDS output sink current 1
N-channel IDS output sink current 2
(for VS > 2.6 V)
N-channel IDS output sink current 3
(for VS > 3.9 V)
P-channel IDS output source current 1
(for VS < 4.0 V)
P-channel IDS output source current 2
(for VS < 5.7 V)
P-channel IDS output source current 3
(for VS < 5.7 V)
VDD = 1.2 V; VDS = 0.5 V
VDS = 0.5 V; VDD = 2.4 V
VDS = 0.5 V; VDD = 3.6 V
VDS = 0.5 V; VDD = 4.8 V
VDS = 0.5 V; VDD = 6.0 V;
4.0 V < VS < 5.7 V
VDS = 0.5 V; VDD = 8.4 V
2
Fig. 17
3
Fig. 18
–0.23
–1.6
–3.2
0.36
0.46
0.59
–1.4
–8.3
–14.7
2.1
2.5
3.3
–
mA
–
mA
–
mA
–
mA
–
mA
–
mA
2001 Jun 19
4