74F676 Datasheet, PDF (4/10 Pages) NXP Semiconductors – 16-bit serial/parallel-in, serial-out shift register 3-State

Philips Semiconductors
16-bit serial/parallel-in, serial-out shift register (3-State)
Product specification
74F676
ABSOLUTE MAXIMUM RATINGS
(Operation beyond the limits set forth in this table may impair the useful life of the device.
Unless otherwise noted these limits are over the operating free-air temperature range.)
SYMBOL
PARAMETER
V_CC
V_IN
I_IN
V_OUT
I_OUT
T_amb
T_stg
Supply voltage
Input voltage
Input current
Voltage applied to output in High output state
Current applied to output in Low output state
Operating free-air temperature range
Storage temperature
RATING
–0.5 to +7.0
–0.5 to +7.0
–30 to +5.0
–0.5 to +V_CC
40
0 to +70
–65 to +150
UNIT
V
V
mA
V
mA
°C
°C
RECOMMENDED OPERATING CONDITIONS
SYMBOL
PARAMETER
V_CC
V_IH
V_IL
I_IK
I_OH
I_OL
T_amb
Supply voltage
High-level input voltage
Low-level input voltage
Input clamp current
High-level output current
Low-level output current
Operating free-air temperature range
LIMITS
MIN NOM MAX
4.5
5.0
5.5
2.0
0.8
–18
–1
20
0
70
UNIT
V
V
V
mA
mA
mA
°C
DC ELECTRICAL CHARACTERISTICS
(Over recommended operating free-air temperature range unless otherwise noted.)
SYMBOL
PARAMETER
TEST CONDITIONS^{NO TAG}
LIMITS
MIN
TYP
NO TAG
MAX
UNIT
V_OH
High-level output voltage
V_CC = MIN, V_IL = MAX,
±10%V_CC
2.5
V_IH = MIN, I_OH = MAX
±5%V_CC
2.7
3.4
V
V
V_OL
Low-level output voltage
V_CC = MIN, V_IL = MAX,
V_IH = MIN, I_OL = MAX
±10%V_CC
±5%V_CC
0.30 0.50
V
0.30 0.50
V
V_IK
Input clamp voltage
V_CC = MIN, I_I = I_IK
–0.73 –1.2
V
I_I
Input current at maximum input voltage
V_CC = MAX, V_I = 7.0V
100
µA
I_IH
High-level input current
V_CC = MAX, V_I = 2.7V
20
µA
I_IL
Low-level input current
V_CC = MAX, V_I = 0.5V
–0.6
mA
I_OS
Short-circuit output current^{NO TAG}
V_CC = MAX
–60
–150
mA
I_CC
Supply current (total)
V_CC = MAX
48
72
mA
NOTES:
1. For conditions shown as MIN or MAX, use the appropriate value under the recommended operating conditions for the applicable type.
2. All typical values are at V_CC = 5V, T_amb = 25°C.
3. Not more than one output should be shorted at a time. For testing I_OS, the use of high-speed test apparatus and/or sample-and-hold
techniques are preferable in order to minimize internal heating and more accurately reflect operational values. Otherwise, prolonged shorting
of a High output may raise the chip temperature well above normal and thereby cause invalid readings in other parameter tests. In any
sequence of parameter tests, I_OS should be performed last.
1990 Apr 18
4