74F395 Datasheet, PDF (4/7 Pages) NXP Semiconductors – 4-bit cascadable shift register 3-State

Philips Semiconductors
4-bit cascadable shift register (3-State)
Product specification
74F395
DC ELECTRICAL CHARACTERISTICS
(Over recommended operating free-air temperature range unless otherwise noted.)
SYMBOL
PARAMETER
TEST CONDITIONS¹
LIMITS
MIN TYP² MAX
UNIT
V_OH
V_OL
V_IK
I_I
I_IH
I_IL
I_OZH
±10%V_CC
2.5
V
High-level output voltage
Qs
V_CC = MIN,
V_IL = MAX,
I_OH=–1mA
±5%V_CC
2.7
3.4
V
V_IH=MIN
±10%V_CC
2.4
V
Q0–Q3
I_OH =–3mA
±5%V_CC
2.7
V
Low-level output voltage
V_CC = MIN,
V_IL = MAX,
V_IH = MIN,
I_OL = MAX
±10%V_CC
±5%V_CC
0.35 0.50
V
0.35 0.50
V
Input clamp voltage
Input current at maximum input voltage
V_CC = MIN, I_I = I_IK
V_CC = MAX, V_I = 7.0V
–0.73 –1.2
V
100
µA
High-level input current
V_CC = MAX, V_I = 2.7V
20
µA
Low-level input current
V_CC = MAX, V_I = 0.5V
–0.6
mA
Off-state output current High
level of voltage applied
Q0–Q3
only
V_CC = MAX, V_O = 2.7V
50
µA
I_OZL
Off-state output current Low
level of voltage applied
Q0–Q3
only
V_CC = MAX, V_O = 0.5V
–50
µA
I_OS
Short-circuit output current³
V_CC = MAX
–60
–150
mA
I_CCH
MR=PE=Dn=Ds=4.5V,
OE=GND, CP=#
33
48
mA
I_CC
Supply current (total)
I_CCL
V_CC = MAX
MR=OE=Dn=Ds=GND,
PE=4.5V, CP=#
35
50
mA
I_CCZ
MR=Dn=Ds=GND,
OE=4.5V
32
46
mA
NOTES:
1. For conditions shown as MIN or MAX, use the appropriate value specified under recommended operating conditions for the applicable type.
2. All typical values are at V_CC = 5V, T_amb = 25°C.
3. Not more than one output should be shorted at a time. For testing I_OS, the use of high-speed test apparatus and/or sample-and-hold
techniques are preferable in order to minimize internal heating and more accurately reflect operational values. Otherwise, prolonged shorting
of a High output may raise the chip temperature well above normal and thereby cause invalid readings in other parameter tests. In any
sequence of parameter tests, I_OS tests should be performed last.
1990 Oct 23
4