10H20EV8 Datasheet, PDF (4/17 Pages) NXP Semiconductors – ECL programmable array logic

Philips Semiconductors Programmable Logic Devices
ECL programmable array logic
Product specification
10H20EV8/10020EV8
ABSOLUTE MAXIMUM RATINGS¹
SYMBOL
PARAMETER
RATING
UNIT
V_EE
Supply voltage
–8.0
V
V_IN
Input voltage (V_IN should never be more negative than V_EE)
0 to V_EE
V
I_O
Output source current
–50
mA
T_S
Operating Temperature range
–55 to +150
°C
T_J
Storage Temperature range
Ceramic Package
+165
°C
Plastic Package
+150
°C
NOTE:
1. Stresses above those listed may cause malfunction or permanent damage to the device. This is a stress rating only. Functional operation at
these or any other condition above those indicated in the operational and programming specification of the device is not implied.
DC OPERATING CONDITIONS 10H20EV8
TEST
LIMITS
SYMBOL
PARAMETER
CONDITIONS
MIN NOM MAX
UNIT
V_CC, V_CO1, V_CO2
Circuit ground
0
0
0
V
V_EE
Supply voltage (negative)
–5.2
V
T_amb = 0°C
–1170
–840
mV
V_IH
High level input voltage
T_amb = +25°C
–1130
–810
mV
T_amb = +75°C
–1070
–735
mV
T_amb = 0°C
–1950
–1480
mV
V_IL
Low level input voltage
T_amb = +25°C
–1950
–1480
mV
T_amb = +75°C
–1980
–1450
mV
T_amb
Operating ambient temperature range
0
+25
+75
°C
NOTE:
When operating at other than the specified V_EE voltage (–5.2V), the DC and AC Electrical Characteristics will vary slightly from specified values.
DC OPERATING CONDITIONS 10020EV8
TEST
LIMITS
SYMBOL
PARAMETER
CONDITIONS
MIN NOM MAX
UNIT
V_CC, V_CO1, V_CO2
V_EE
V_EE
Circuit ground
Supply voltage
Supply voltage when opetating with the 10K
or 10KH ECL family
0
0
0
V
–4.8 –4.5 –4.2
V
–5.7
V
V_EE = –4.2V
–1150
V_IH
High level input voltage
V_EE = –4.5V
–1165
–880
mV
V_EE = –4.8V
–1165
V_EE = –4.2V
–1475
mV
V_IL
Low level input voltage
V_EE = –4.5V
–1810
–1475
mV
V_EE = –4.8V
–1490
mV
T_amb
Operating ambient temperature range
0
+25
+85
°C
NOTE:
When operating at other than the specified V_EE voltages (–4.2V, –4.5V, –4.8V), the DC and AC Electrical Characteristics will vary slightly from
their specified values.
October 22, 1993
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