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PHX3055L Datasheet, PDF (3/7 Pages) NXP Semiconductors – PowerMOS transistor Logic level FET
Philips Semiconductors
PowerMOS transistor
Logic level FET
Preliminary specification
PHX3055L
120 PD%
110
Normalised Power Derating
with heatsink compound
100
90
80
70
60
50
40
30
20
10
0
0 20 40 60 80 100 120 140
Ths / C
Fig.1. Normalised power dissipation.
PD% = 100⋅PD/PD 25 ˚C = f(Ths)
ID%
120
110
Normalised Current Derating
with heatsink compound
100
90
80
70
60
50
40
30
20
10
0
0 20 40 60 80 100 120 140
Ths / C
Fig.2. Normalised continuous drain current.
ID% = 100⋅ID/ID 25 ˚C = f(Ths); conditions: VGS ≥ 10 V
ID, Drain current (Amps)
100
10
RDS(ON) = VDS/ID
DC
1
tp = 10 us
100 us
1 ms
10 ms
100 ms
0.1
1
10
100
VDS, Drain-source voltage (Volts)
1000
Fig.3. Safe operating area. Ths = 25 ˚C
ID & IDM = f(VDS); IDM single pulse; parameter tp
Zth(j-hs)
10
Transient Thermal Impedance (K/W) PHX3055E
0.5
1 0.2
0.1
0.05
0.1 0.02
0.01
0
PD
tp
D
=
tp
T
T
t
0.001
1us 10us 100us 1ms 10ms 0.1s 1s 10s
tp, pulse width (s)
Fig.4. Transient thermal impedance.
Zth j-hs = f(t); parameter D = tp/T
ID, Drain current (Amps)
15
10 V
10
5
Tj = 25 C
PHP3055E
7V
6.5 V
6V
5.5 V
5V
VGS = 4.5 V
0
0
5
10
15
20
25
30
VDS, Drain-Source voltage (Volts)
Fig.5. Typical output characteristics.
ID = f(VDS); parameter VGS
RDS(on), Drain-Source on resistance (Ohms) PHP3055E
0.4
5.5 V 6 V 6.5 V 7 V
0.3
0.2
10 V
0.1
VGS = 15 V
Tj = 25 C
0
0
5
10
15
20
ID, Drain current (Amps)
Fig.6. Typical on-state resistance.
RDS(ON) = f(ID); parameter VGS
October 1997
3
Rev 1.000