74F410 Datasheet, PDF (3/5 Pages) NXP Semiconductors – Register stack 16x4 RAM 3-State output register

Philips Semiconductors FAST Products
Register stack – 16×4 RAM 3-State output register
Product specification
74F410
RECOMMENDED OPERATING CONDITIONS
SYMBOL
PARAMETER
V_CC
V_IH
V_IL
I_Ik
I_OH
I_OL
T_amb
Supply voltage
High–level input voltage
Low–level input voltage
Input clamp current
High–level output current
Low–level output current
Operating free air temperature range
LIMITS
T UNIT
MIN
NOM
MAX
A
=
4.5
5.0
5.5
–_V
4
2.0
0^V
0.8
t
o
V
–18 ⁺ mA
8
–3
5 ^mA
24
° mA
0
+70
C _°C
DC ELECTRICAL CHARACTERISTICS
(Over recommended operating free-air temperature range unless otherwise noted.)
SYMBOL
PARAMETER
TEST CONDITIONS¹
LIMITS
UNIT
MIN TYP² MAX
V_OH
High-level output voltage
V_CC = MIN, V_IL = MAX
V_IH = MIN, I_OH = MAX
V_OL
Low-level output voltage
V_CC = MIN, V_IL = MAX
V_IH = MIN, I_OL = MAX
V_IK
Input clamp voltage
V_CC = MIN, I_I = I_IK
I_I
Input current at maximum input voltage V_CC = MAX, V_I = 7.0V
I_IH
High–level input current
V_CC = MAX, V_I = 2.7V
I_IL
Low–level input current
others V_CC = MAX, V_I = 0.5V
CP, CS
±10%V_CC
2.4
±5%V_CC
2.7
±10%V_CC
±5%V_CC
V
V
0.35 0.50
V
0.35 0.50
V
-0.73 -1.2
V
100
µA
20
µA
-0.6 mA
-1.2 mA
I_OZH
Offset–output current,
high–level voltage applied
V_CC = MAX, V_I = 2.7V
50
µA
I_OZL
Offset–output current,
low–level voltage applied
V_CC = MAX, V_I = 0.5V
–50
µA
I_OS
Short-circuit output current³
V_CC = MAX
-60
-150 mA
I_CC
Supply current (total)
V_CC = MAX
45
70
mA
NOTES:
1. For conditions shown as MIN or MAX, use the appropriate value specified under recommended operating conditions for the applicable type.
2. All typical values are at V_CC = 5V, T_amb = 25°C.
3. Not more than one output should be shorted at a time. For testing I_OS, the use of high-speed test apparatus and/or sample-and-hold
techniques are preferable in order to minimize internal heating and more accurately reflect operational values. Otherwise, prolonged shorting
of a high output may raise the chip temperature well above normal and thereby cause invalid readings in other parameter tests. In any
sequence of parameter tests, I_OS tests should be performed last.
January 8, 1990
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