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| 74HC4066_2004 Datasheet, PDF (20/27 Pages) NXP Semiconductors – Quad bilateral swiches | |||
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Philips Semiconductors
Quad bilateral switches
Product speciï¬cation
74HC4066; 74HCT4066
TEST CIRCUIT AND WAVEFORMS
handbook, full pagewidth
VI
PULSE
GENERATOR
VCC Vis
VO
D.U.T.
RT
VCC
RL switch
open
CL
GND
MGR273
TEST
tPZH
tPZL
tPHZ
tPLZ
other
SWITCH
GND
VCC
GND
VCC
open
Vis
VCC
GND
VCC
GND
pulse
Definitions for test circuit:
RL = Load resistance.
CL = Load capacitance including jig and probe capacitance.
RT = Termination resistance should be equal to the output impedance ZO of the pulse generator.
tf = 6 ns; when measuring fmax, there is no
constraint to tr and tf with 50 % duty factor.
Fig.21 Test circuit for measuring AC performance.
handbook, full pagewidth
negative
input pulse
positive
input pulse
tW
90%
VM
10%
tTHL (tf)
tTLH (tr)
10%
90%
VM
tW
amplitude
0V
tTLH (tr)
tTHL (tf)
amplitude
0V
MGR274
FAMILY
74HC4066
74HCT4066
AMPLITUDE VM
VCC
3.0 V
50 %
1.3 V
tr and tf
fmax; PULSE
WIDTH
OTHER
<2 ns
6 ns
<2 ns
6 ns
Fig.22 Input pulse definitions.
2004 Nov 11
20
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