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BU2727AW Datasheet, PDF (2/7 Pages) NXP Semiconductors – Silicon Diffused Power Transistor
Philips Semiconductors
Silicon Diffused Power Transistor
Product specification
BU2727AW
THERMAL RESISTANCES
SYMBOL
Rth j-mb
Rth j-a
PARAMETER
Junction to mounting base
Junction to ambient
CONDITIONS
-
in free air
TYP.
-
45
MAX.
1.0
-
UNIT
K/W
K/W
STATIC CHARACTERISTICS
Tmb = 25 ˚C unless otherwise specified
SYMBOL PARAMETER
ICES
Collector cut-off current 2
ICES
IEBO
BVEBO
VCEOsust
Emitter cut-off current
Emitter-base breakdown voltage
Collector-emitter sustaining voltage
VCEsat
VBEsat
hFE
hFE
Collector-emitter saturation voltage
Base-emitter saturation voltage
DC current gain
CONDITIONS
VBE = 0 V; VCE = VCESMmax
VBE = 0 V; VCE = VCESMmax;
Tj = 125 ˚C
VEB = 7.5 V; IC = 0 A
IB = 1 mA
IB = 0 A; IC = 100 mA;
L = 25 mH
IC = 5.0 A; IB = 0.91 A
IC = 5.0 A; IB = 0.91 A
IC = 0.1 A; VCE = 5 V
IC = 5 A; VCE = 1 V
MIN.
-
-
-
7.5
825
-
0.78
12
5.5
TYP. MAX. UNIT
-
1.0 mA
-
2.0 mA
-
1.0 mA
13.5 -
V
-
-
V
-
1.0
V
0.86 0.95 V
22 35
8
11
DYNAMIC CHARACTERISTICS
Tmb = 25 ˚C unless otherwise specified
SYMBOL PARAMETER
Switching times (64 kHz line
deflection circuit)
ts
Turn-off storage time
tf
Turn-off fall time
CONDITIONS
ICM = 5.0 A; LC = 260 µH; Cfb = 4.8 nF;
VCC = 180 V; IB(end) = 0.9 A;
LB = 0.6 µH; -VBB = 2 V;
(-dIB/dt = 3.33 A/µs)
TYP.
2.2
tbf
MAX.
tbf
tbf
UNIT
µs
µs
+ 50v
100-200R
Horizontal
Oscilloscope
Vertical
100R
1R
6V
30-60 Hz
Fig.1. Test circuit for VCEOsust.
IC / mA
250
200
100
0
VCE / V
min
VCEOsust
Fig.2. Oscilloscope display for VCEOsust.
2 Measured with half sine-wave voltage (curve tracer).
September 1997
2
Rev 1.100