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PBSS302PD Datasheet, PDF (11/14 Pages) NXP Semiconductors – 40 V PNP low VCEsat (BISS) transistor
Philips Semiconductors
8. Test information
PBSS302PD
40 V PNP low VCEsat (BISS) transistor
−IB
90 %
10 %
−IC
90 %
−IBon (100 %)
input pulse
(idealized waveform)
− I Boff
output pulse
(idealized waveform)
−IC (100 %)
10 %
td
tr
t on
Fig 13. BISS transistor switching time definition
ts
t off
t
tf
006aaa266
VBB
VCC
(probe)
oscilloscope
450 Ω
VI
RB
R2
R1
RC
Vo (probe)
oscilloscope
450 Ω
DUT
(1) VCC = −10 V; IC = −2 A; IBon = −0.1 A; IBoff = 0.1 A
Fig 14. Test circuit for switching times
mgd624
9397 750 14513
Product data sheet
Rev. 01 — 18 April 2005
© Koninklijke Philips Electronics N.V. 2005. All rights reserved.
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