D-436-42 Datasheet, PDF (2/4 Pages) PANDUIT CORP. – IN-LINE SPLICE SEALING SYSTEM, MULTI-WIRE

SPECIFICATION CONTROL DRAWING
The test assemblies for qualification testing shall be 3 to 3 in-line splices made in wire conforming
to MIL-W-81044/12 or MIL-W-16878/4. The assemblies shall be divided equally between the maximum
and minimum wire size as shown below:
Assembly
D-436-42
D-436-43
Minimum
24
22
Maximum
22
18
The qualification sample shall consists of 35 assemblies and 8 uninstalled sleeves.
1.1 Acceptance Testing:
Acceptance sampling shall be in accordance with ANSI/ASQC Z1.4, Inspection Level S-4. The
Acceptable Quality Level shall be 4.0 for all defects.
Acceptance tests shall consist of visual and dimensional examination.
2.0 QUALIFICATION TESTING:
.1
All sleeves shall be tested for compliance with Sheet 1 in regard to:
Property
Test Method
Material and Appearance
Dimensions
Visual Examination
MIL-I-23053, Paragraph 4.6.3
2.2 Test Group A: Ten assemblies shall pass the post conditioning tests after conditioning in the
sequence shown:
Post Conditioning
Requirement
Test Method
Insulation Resistance
Altitude Immersion
Insulation Resistance
Dielectric Withstanding
5000 M @500V d-c
75,000 ft.
5000 M @500V d-c
2.5Kv (rms) for 1 min.
MIL-W-81044, Par. 4.7.5.2
MIL-C-26500, Par. 4.7.21
MIL-W-81044, Par. 4.7.5.2
MIL-W-81044, Par. 4.7.5.1
Conditioning
Parameters
Test method
Altitude Immersion
Immersion
Temperature Cycling
Moisture Resistance
Fluid Immersion
Heat Aging
75,000 ft.
Condition C
-65C to 150C (5 cycles)
Step 7b not required
MIL-H-5606, MIL-L-7808
96 hours @200C
MIL-C-26500, Par. 4.7.21
Method 104*
Method 102*
Method 106*
MIL-T-7928, Par. 4.8.8
Method 108*
2.3 Test Group B: Ten Assemblies:
Test Sequence
Requirement
Test Method
TE Connectivity
305 Constitution Drive
Menlo Park, CA 94025, USA
Raychem
Products
TITLE :
IN-LINE SPLICE SEALING
SYSTEM, MULTI-WIRE
UNLESS OTHERWISE SPECIFIED DIMENSIONS ARE IN MILLIMETERS.
INCHES DIMENSIONS ARE BETWEEN BRACKETS.
TOLERANCES:
0.00 N/A
0.0 N/A
0 N/A
ANGLES: N/A
ROUGHNESS IN
MICRON
TE Connectivity reserves the right to amend this
drawing at any time. Users should evaluate the
suitability of the product for their application.
DRAWN BY:
M. FORONDA
REPLACES:
N/A
DCR NUMBER:
D001303
If this document is printed it becomes uncontrolled. Check for the latest revision.
DOCUMENT NO.: D-436-42/-43
DATE:
15-Apr-11
DOC ISSUE:
2
PROD. REV.
SCALE: SIZE:
SEE TABLE None
A
SHEET:
2 of 4