KAF-0261 Datasheet, PDF (8/15 Pages) ON Semiconductor – Full Frame CCD Image Sensor

KAF−0261
DEFECT SPECIFICATIONS
Table 8. MAXIMUM DEFECT COUNTS
Point Defect
10
Cluster Defect
4
Column Defect
0
Dark Defects
A pixel which deviates by more than 20% from
neighboring pixels when illuminated to 70% of saturation
Bright Defect
A pixel whose dark current exceeds 4500
electrons/pixel/second at 25°C
Cluster Defect
A grouping of not more than 5 adjacent point defects
Column Defect
A grouping of point defects along a single column. (Dark
Column)
A column that contains a pixel whose dark current
exceeds 150,000 electrons/pixel/second at 25°C. (Bright
Column)
A column that does not exhibit the minimum charge
capacity specification. (Low charge capacity)
A column that loses > 500 electrons when the array is
illuminated to a signal level of 2000 electrons/pix. (Trap like
defects)
Neighboring Pixels
The surrounding 128 x 128 pixels of ±64 columns/rows
Defects are separated by no less than 3 pixels in any one
direction.
1,512
512,512
All pixels subject to defect specification
1,1
512,1
Figure 6. Active Pixel Region
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