74HC374 Datasheet, PDF (7/9 Pages) NXP Semiconductors – Octal D-type flip-flop; positive edge-trigger; 3-state

DEVICE
UNDER
TEST
TEST POINT
OUTPUT
C_L*
74HC374
TEST CIRCUITS
DEVICE
UNDER
TEST
TEST POINT
OUTPUT
1 kW
C_L*
CONNECT TO V_CC WHEN
TESTING t_PLZ AND t_PZL.
CONNECT TO GND WHEN
TESTING t_PHZ AND t_PZH.
*Includes all probe and jig capacitance
Figure 4.
*Includes all probe and jig capacitance
Figure 5.
D0
D1
D2
D3
D4
D5
D6
D7
3
4
7
8
13
14
17
18
DQ
DQ
DQ
DQ
DQ
DQ
DQ
DQ
Clock ¹¹
Output 1
Enable
C
C
C
C
C
C
C
C
2
5
6
9
12
15
16
19
Q0
Q1
Q2
Q3
Q4
Q5
Q6
Q7
Figure 6. Expanded Logic Diagram
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