74HC374 Datasheet, PDF (4/9 Pages) NXP Semiconductors – Octal D-type flip-flop; positive edge-trigger; 3-state

74HC374
DC ELECTRICAL CHARACTERISTICS (Voltages Referenced to GND)
Guaranteed Limit
Symbol
Parameter
Test Conditions
V_CC – 55 to
(V)
25_C v 85_C v 125_C _Unit
V_IH Minimum High−Level Input Voltage V_out = 0.1 V or V_CC – 0.1 V
|I_out| v 20 mA
2.0
1.50
1.50
1.50
V
3.0
2.10
2.10
2.10
4.5
3.15
3.15
3.15
6.0
4.20
4.20
4.20
V_IL Maximum Low−Level Input Voltage V_out = 0.1 V or V_CC – 0.1 V
|I_out| v 20 mA
2.0
0.50
0.50
0.50
V
3.0
0.90
0.90
0.90
4.5
1.35
1.35
1.35
6.0
1.80
1.80
1.80
V_OH Minimum High−Level Output
Voltage
V_in = V_IH or V_IL
|I_out| v 20 mA
2.0
1.90
1.90
1.90
V
4.5
4.40
4.40
4.40
6.0
5.90
5.90
5.90
V_OL Maximum Low−Level Output
Voltage
V_in = V_IH or V_IL |I_out| v 2.4 mA 3.0
2.48
2.34
2.20
|I_out| v 6.0 mA 4.5
2.98
3.84
3.70
V
|I_out| v 7.8 mA 6.0
5.48
5.34
5.20
V_in = V_IH or V_IL
|I_out| v 20 mA
2.0
0.10
0.10
0.10
V
4.5
0.10
0.10
0.10
6.0
0.10
0.10
0.10
V_in = V_IH or V_IL |I_out| v 2.4 mA 3.0
0.26
0.33
0.40
|I_out| v 6.0 mA 4.5
0.26
0.33
0.40
V
|I_out| v 7.8 mA 6.0
0.26
0.33
0.40
I_in
Maximum Input Leakage Current V_in = V_CC or GND
6.0
±0.1
±1.0
±1.0
mA
I_OZ Maximum Three−State
Leakage Current
Output in High−Impedance State 6.0
V_in = V_IL or V_IH
V_out = V_CC or GND
±0.5
±5.0
±10
mA
I_CC Maximum Quiescent Supply
Current (per Package)
V_in = V_CC or GND
I_out = 0 mA
6.0
4.0
40
40
mA
NOTE: Information on typical parametric values can be found in Chapter 2 of the ON Semiconductor High−Speed CMOS Data Book
(DL129/D).
http://onsemi.com
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