KAF-3200 Datasheet, PDF (6/15 Pages) ON Semiconductor – Full Frame CCD Image Sensor

KAF−3200
IMAGING PERFORMANCE
Typical Operational Conditions
All values measured at 25°C, and nominal operating conditions. These parameters exclude defective pixels.
Table 4. SPECIFICATIONS
Description
Saturation Signal
Vertical CCD Capacity
Horizontal CCD Capacity
Output Node Capacity
Symbol
Nsat
Min
Nom.
Max
50,000
100,000
100,000
55,000
110,000
110,000
120,000
Units
e^−/pixel
Notes
1
Verification
Plan
design¹¹
Quantum Efficiency with Microlenses
Red
55
Blue
70
Green
80
%QE
3
design¹¹
design¹¹
design¹¹
Photoresponse Non−Linearity
PRNL
1
2
%
2
design¹¹
Photoresponse Non−Uniformity
PRNU
1
3
%
3
die¹⁰
Dark Signal
Jdark
15
30
e^−/ pixel / s
4
die¹⁰
6
10
pA/cm²
Dark Signal Doubling Temperature
5
6
7
°C
design¹¹
Dark Signal Non−Uniformity
DSNU
15
30
e^−/ pixel / s
5
die¹⁰
Dynamic Range
DR
72
77
dB
6
design¹¹⁸
Charge Transfer Efficiency
CTE
0.99997 0.99999
die¹⁰
Output Amplifier DC Offset
Vodc
Vrd − 2
Vrd − 1
Vrd
V
7
die¹⁰
Output Amplifier Bandwidth
Output Amplifier Sensitivity
f_−3dB
45
Vout/ne^−
18
20
MHz
mV/e^−
8
design¹¹
design¹¹
Output Amplifier Output Impedance
Zout
175
200
250
W
design¹¹
Noise Floor
ne^−
7
12
electrons
9
die¹⁰
1. For pixel binning applications, electron capacity up to 150,000 can be achieved with modified CCD inputs. Each sensor may have to be
optimized individually for these applications. Some performance parameters may be compromised to achieve the largest signals.
2. Worst case deviation from straight line fit, between 2% and 90% of Nsat.
3. One Sigma deviation of a 128 x 128 sample when CCD illuminated uniformly.
4. Average of all pixels with no illumination at 25°C.
5. Average dark signal of any of 11 x 8 blocks within the sensor. (Each block is 128 x 128 pixels)
6. 20log (Nsat / ne^−) at nominal operating frequency and 25°C.
7. Video level offset with respect to ground.
8. Last output amplifier stage only. Assumes 10 pF off−chip load.
9. Output noise at −10°C, 1 MHz operating frequency (15 MHz bandwidth), and tint = 0 (excluding dark signal).
10. A parameter that is measured on every sensor during production testing.
11. A parameter that is quantified during the design verification activity.
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