CAT5401_13 Datasheet, PDF (6/15 Pages) ON Semiconductor – Quad Digital Potentiometer (POT)

CAT5401
Table 7. A.C. CHARACTERISTICS (Over recommended operating conditions unless otherwise stated.)
Symbol
Parameter
Test Conditions
Min
Typ
t_SU
t_H
t_WH
t_WL
f_SCK
t_LZ
t_RI (Note 8)
t_FI (Note 8)
t_HD
t_CD
t_V
t_HO
t_DIS
t_HZ
t_CS
t_CSS
t_CSH
Data Setup Time
Data Hold Time
SCK High Time
SCK Low Time
Clock Frequency
HOLD to Output Low Z
Input Rise Time
Input Fall Time
HOLD Setup Time
HOLD Hold Time
Output Valid from Clock Low
Output Hold Time
Output Disable Time
HOLD to Output High Z
CS High Time
CS Setup Time
CS Hold Time
50
50
125
125
DC
C_L = 50 pF
100
100
0
250
250
250
Max
Units
ns
ns
ns
ns
3
MHz
50
ns
2
ms
2
ms
ns
ns
250
ns
ns
250
ns
100
ns
ns
ns
ns
Table 8. POWER UP TIMING (Notes 8, 9)
Symbol
Parameter
t_PUR
Power-up to Read Operation
t_PUW
Power-up to Write Operation
8. This parameter is tested initially and after a design or process change that affects the parameter.
9. t_PUR and t_PUW are delays required from the time V_CC is stable until the specified operation can be initiated.
Table 9. WRITE CYCLE LIMITS
Symbol
Parameter
Max
t_WR
Write Cycle Time
5
Max
Units
1
ms
1
ms
Units
ms
Table 10. RELIABILITY CHARACTERISTICS
Symbol
Parameter
Reference Test Method
Min
Max
N_END (Note 10) Endurance
MIL−STD−883, Test Method 1033
1,000,000
T_DR (Note 10)
V_ZAP (Note 10)
I_LTH (Note 10)
Data Retention
ESD Susceptibility
Latch-up
MIL−STD−883, Test Method 1008
MIL−STD−883, Test Method 3015
JEDEC Standard 17
100
2000
100
Units
Cycles/Byte
Years
V
mA
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