CAT5261 Datasheet, PDF (6/15 Pages) Catalyst Semiconductor – Dual Digitally Programmable Potentiometer

CAT5261
POWER UP TIMING ⁽¹⁾⁽²⁾
Symbol Parameter
t_PUR Power-up to Read Operation
t_PUW Power-up to Write Operation
WIPER TIMING
Symbol Parameter
Min
t_WRPO Wiper Response Time After Power Supply Stable
5
t_WRL Wiper Response Time After Instruction Issued
5
WRITE CYCLE LIMITS
Symbol Parameter
t_WR
Write Cycle Time
RELIABILITY CHARACTERISTICS
Symbol
N_END(3)
T_DR(3)
V_ZAP(3)
I_LTH(3)
Parameter
Endurance
Data Retention
ESD Susceptibility
Latch-Up
Reference Test Method
MIL-STD-883, Test Method 1033
MIL-STD-883, Test Method 1008
MIL-STD-883, Test Method 3015
JEDEC Standard 17
Min
1,000,000
100
2000
100
Notes:
(1) This parameter is tested initially and after a design or process change that affects the parameter.
(2) t_PUR and t_PUW are delays required from the time V_CC is stable until the specified operation can be initiated.
(3) This parameter is tested initially and after a design or process change that affects the parameter.
Max Units
1
ms
1
ms
Max Units
10
µs
10
µs
Max Units
5
ms
Max
Units
Cycles/Byte
Years
V
mA
Figure 1. Synchronous Data Timing
V_IH
CS
SCK
V_IL
t_CSS
V_IH
V_IL
V_IH
SI
VIL
t_WH
t_SU
t_H
VALID IN
V_OH
SO
V_OL
HI-Z
t_CS
t_CSH
t_WL
t_RI
tFI
t_V
t_HO
t_DIS
HI-Z
Note: Dashed Line = mode (1, 1)
Doc. No. MD-2122 Rev. G
6
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Characteristics subject to change without notice