NLX1G10 Datasheet, PDF (5/8 Pages) ON Semiconductor – 3-Input NAND Gate

NLX1G10
t_R
INPUT
A and B
90%
50%
10%
90%
50%
t_F
10%
V_CC
GND
t_PHL
t_PLH
V_OH
OUTPUT Y
50%
50%
V_OL
t_R = t_F = 2.5 ns, 10% to 90%, f = 1 MHz, t_W = 500 ns
Figure 3. Switching Waveforms
INPUT
OUTPUT
R_L
C_L
A 1 MHz square input wave is recommended
for propagation delay tests
Figure 4. Test Circuit
ORDERING INFORMATION
Device
Package
Shipping^†
NLX1G10AMX1TCG
ULLGA6, 1.45 x 1.0, 0.5P
(Pb−Free)
3000 / Tape & Reel
NLX1G10BMX1TCG
ULLGA6, 1.2 x 1.0, 0.4P
(Pb−Free)
3000 / Tape & Reel
NLX1G10CMX1TCG
ULLGA6, 1.0 x 1.0, 0.35P
(Pb−Free)
3000 / Tape & Reel
†For information on tape and reel specifications, including part orientation and tape sizes, please refer to our Tape and Reel Packaging
Specifications Brochure, BRD8011/D.
http://onsemi.com
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