NBSG16M Datasheet, PDF (5/12 Pages) ON Semiconductor – 2.5V/3.3V Multilevel Input to CML Clock/Data Receiver/Driver/Translator Buffer

NBSG16M
Table 5. DC CHARACTERISTICS, POSITIVE CML OUTPUT V_CC = 2.5 V; V_EE = 0 V (Note 6)
−40°C
25°C
85°C
Symbol
Characteristic
I_CC
Positive Power Supply Current
V_OH
Output HIGH Voltage (Note 7)
Min Typ
37
43
V_CC − V_CC −
40
10
Max
51
V_CC
Min Typ
37
43
V_CC − V_CC −
40
10
Max
51
V_CC
Min
37
V_CC −
40
Typ
43
V_CC −
10
Max
51
V_CC
Unit
mA
mV
V_OL
Output LOW Voltage (Note 6)
V_CC − V_CC−
400 330
V_CC − V_CC−
400 330
V_CC − V_CC− mV
400 330
V_IH
Input HIGH Voltage
(Single−Ended) (Note 8)
V_EE + V_CC − V_CC V_EE + V_CC − V_CC V_EE+ V_CC − V_CC
V
1.275 1.0*
1.275 1.0*
1..275 1.0*
V_IL
Input LOW Voltage
(Single−Ended) (Note 8)
V_EE V_CC − V_IH− V_EE V_CC − V_IH− V_EE V_CC − V_IH−
V
1.4* 0.150
1.4* 0.150
1.4* 0.150
V_BB
V_IHCMR
ECL Reference Voltage Output
Input HIGH Voltage Common Mode
Range (Note 8)
(Differential Configuration)
1075 1170 1265 1075 1170 1265 1075 1170 1265 mV
1.2
2.5 1.2
2.5 1.2
2.5 V
R_TIN
R_TOUT
Internal Input Termination Resistor
Internal Output Termination
Resistor
45
50
55
45
50
55
45
50
55
W
45
50
55
45
50
55
45
50
55
W
I_IH
Input HIGH Current (@ V_IH)
60 100
60 100
60 100 mA
I_IL
Input LOW Current (@ V_IL)
25
50
25
50
25
50 mA
NOTE: Device will meet the specifications after thermal equilibrium has been established when mounted in a test socket or printed circuit
board with maintained transverse airflow greater than 500 lfpm. Electrical parameters are guaranteed only over the declared
operating temperature range. Functional operation of the device exceeding these conditions is not implied. Device specification
limit values are applied individually under normal operating conditions and not valid simultaneously.
6. Input and output parameters vary 1:1 with V_CC. V_EE can vary +0.125 V to −0.965 V.
7. All loading with 50 W to V_CC.
8. V_IHCMR min varies 1:1 with V_EE, V_IHCMR max varies 1:1 with V_CC. The V_IHCMR range is referenced to the most positive side of the differen-
tial input signal.
*Typicals used for testing purposes.
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