CAT5133ZI-10-GT3 Datasheet, PDF (5/10 Pages) ON Semiconductor – 16 Volt Digitally Programmable Potentiometer with 128 Taps and an Increment Decrement Interface

CAT5133
DC ELECTRICAL CHARACTERISTICS
V_CC = +2.7V to +6.0V, unless otherwise specified.
Symbol
I_CC1
I_CC2
I_SB(VCC)
I_SB(V+)
I_LI
I_LO
V_IL
V_IH
V_OL1
Parameter
Power Supply Current
Power supply Current
Nonvolatile WRITE
Standby Current (V_CC = 5V)
V+ Standby Current
Input Leakage Current
Output Leakage Current
Input Low Voltage
Input High Voltage
Output Low Voltage (V_CC = 3.0V)
Test Conditions
V_CC = 5.5V, f_INC = 1MHz, Input = GND
V_CC = 5.5V, f_INC = 1MHz, Input = GND
V_IN = GND or V_CC, INC = VCC
V_CC = 5V, V+ = 16V
V_IN = GND to V_CC
V_OUT = GND to V_CC
I_OL = 3 mA
Min
Max Units
1
mA
3.0 mA
5
µA
10
µA
10
µA
10
µA
-1 V_CC x 0.3 V
V_CC x 0.7 V_CC + 1.0 V
0.4
V
CAPACITANCE
T_A = 25ºC, f = 1.0MHz, V_CC = 5.0V
Symbol
C_I/O
C_IN
Parameter
Input/Output Capacitance (SDA)
Input Capacitance (A0, A1, SCL)
POWER UP TIMING⁽¹⁾⁽²⁾
Symbol
t_PUR
t_PUW
Parameter
Power-up to Read Operation
Power-up to Write Operation
Test Conditions
V_I/O = 0V⁽¹⁾
V_IN = 0V⁽¹⁾
Min
Max Units
8
pF
6
pF
Min
Max Units
1
ms
1
ms
WIPER TIMING
Symbol
t_WRPO
t_WRL
Parameter
Wiper Response Time After Power Supply Stable
Wiper Response Time After Instruction Issued
Min
Max Units
5
10
μs
5
10
μs
WRITE CYCLE LIMITS
Symbol Parameter
t_WR
Write Cycle Time
Min
Max Units
5
ms
RELIABILITY CHARACTERISTICS
(Over recommended operating conditions unless otherwise stated.)
Symbol
N_END(1)
T_DR(1)
Parameter
Endurance
Data Retention
Reference Test Method
MIL-STD-883, Test Method 1033
MIL-STD-883, Test Method 1008
Min
100,000
100
Max
Units
Cycles/Byte
Years
Notes:
(1) This parameter is tested initially and after a design or process change that affects the parameter.
(2) t_PUR and t_PUW are the delays required from the time V_CC is stable until the specified operation can be initiated.
© 2008 SCILLC. All rights reserved.
5
Characteristics subject to change without notice
Doc. No. MD-2125 Rev. D