N24C64 Datasheet, PDF (4/11 Pages) ON Semiconductor – 64 Kb I2C CMOS Serial EEPROM

N24C64
Table 5. A.C. CHARACTERISTICS
(V_CC = 1.7 V / 1.6 V* to 5.5 V, T_A = −40°C to +85°C and V_CC = 1.8 V to 5.5 V, T_A = −40°C to +125°C unless otherwise noted.) (Note 6)
Standard
Fast
Fast−Plus
Symbol
Parameter
Min
Max
Min
Max
Min
Max
Units
F_SCL
Clock Frequency
100
400
1,000
kHz
t_HD:STA
START Condition Hold Time
4
0.6
0.25
ms
t_LOW
Low Period of SCL Clock
4.7
1.3
0.45
ms
t_HIGH
High Period of SCL Clock
4
0.6
0.40
ms
t_SU:STA
START Condition Setup Time
4.7
0.6
0.25
ms
t_HD:DAT
Data In Hold Time
0
0
0
ms
t_SU:DAT
Data In Setup Time
250
100
50
ns
t_R (Note 7)
SDA and SCL Rise Time
1,000
300
100
ns
t_F (Note 7)
SDA and SCL Fall Time
300
300
100
ns
t_SU:STO
STOP Condition Setup Time
4
0.6
0.25
ms
t_BUF
Bus Free Time Between
4.7
1.3
0.5
ms
STOP and START
t_AA
SCL Low to Data Out Valid
3.5
0.9
t_DH (Note 7)
Data Out Hold Time
100
100
T_i (Note 7)
Noise Pulse Filtered at SCL
50
50
and SDA Inputs
0.40
ms
50
ns
50
ns
t_SU:WP
WP Setup Time
0
0
0
ms
t_HD:WP
WP Hold Time
2.5
2.5
1
ms
t_WR
Write Cycle Time
4
4
4
ms
t_PU (Notes 7, 8) Power-up to Ready Mode
0.35
0.35
0.35
ms
*V_CC(min) = 1.6 V for Read operations, T_A = −20°C to +85°C
6. Test conditions according to “A.C. Test Conditions” table.
7. Tested initially and after a design or process change that affects this parameter.
8. t_PU is the delay between the time V_CC is stable and the device is ready to accept commands.
Table 6. A.C. TEST CONDITIONS
Input Levels
Input Rise and Fall Times
0.2 x V_CC to 0.8 x V_CC for V_CC ≥ 2.2 V; 0.15 x V_CC to 0.85 x V_CC for V_CC < 2.2 V
≤ 50 ns
Input Reference Levels
Output Reference Levels
Output Load
0.3 x V_CC, 0.7 x V_CC
0.3 x V_CC, 0.7 x V_CC
Current Source: I_OL = 6 mA (V_CC ≥ 2.5 V); I_OL = 2 mA (V_CC < 2.5 V); C_L = 100 pF
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