MC74AC161_15 Datasheet, PDF (4/12 Pages) ON Semiconductor – Synchronous Presettable Binary Counter

MC74AC161, MC74ACT161, MC74AC163, MC74ACT163
RECOMMENDED OPERATING CONDITIONS
Symbol
Parameter
Min
Typ
Max
Unit
V_CC
Supply Voltage
′AC
2.0
5.0
6.0
V
′ACT
4.5
5.0
5.5
V_IN, V_OUT DC Input Voltage, Output Voltage (Ref. to GND)
0
−
V_CC
V
t_r, t_f
Input Rise and Fall Time (Note 1)
′AC Devices except Schmitt Inputs
V_CC @ 3.0 V
−
150
−
V_CC @ 4.5 V
−
40
−
ns/V
V_CC @ 5.5 V
−
25
−
t_r, t_f
Input Rise and Fall Time (Note 2)
′ACT Devices except Schmitt Inputs
V_CC @ 4.5 V
−
10
−
ns/V
V_CC @ 5.5 V
−
8.0
−
T_J
Junction Temperature (PDIP)
−
−
140
°C
T_A
Operating Ambient Temperature Range
−40
25
85
°C
I_OH
Output Current − High
−
−
−24
mA
I_OL
Output Current − Low
−
−
24
mA
1. V_IN from 30% to 70% V_CC; see individual Data Sheets for devices that differ from the typical input rise and fall times.
2. V_IN from 0.8 V to 2.0 V; see individual Data Sheets for devices that differ from the typical input rise and fall times.
DC CHARACTERISTICS
74AC
74AC
Symbol
Parameter
V_CC
(V)
T_A = +25°C
T_A =
−40°C to
+85°C
Unit
Conditions
Typ Guaranteed Limits
V_IH
Minimum High Level
Input Voltage
3.0
1.5 2.1
2.1
4.5 2.25 3.15
3.15
5.5 2.75 3.85
3.85
V_OUT = 0.1 V
V
or V_CC − 0.1 V
V_IL
Maximum Low Level
Input Voltage
3.0
1.5 0.9
0.9
4.5 2.25 1.35
1.35
5.5 2.75 1.65
1.65
V_OUT = 0.1 V
V
or V_CC − 0.1 V
V_OH
Minimum High Level
Output Voltage
3.0 2.99 2.9
2.9
4.5 4.49 4.4
4.4
5.5 5.49 5.4
5.4
I_OUT = −50 mA
V
3.0
− 2.56
2.46
4.5
− 3.86
3.76
5.5
− 4.86
4.76
*V_IN = V_IL or V_IH
−12 mA
V
I_OH
−24 mA
−24 mA
V_OL
Maximum Low Level
Output Voltage
3.0 0.002 0.1
0.1
4.5 0.001 0.1
0.1
5.5 0.001 0.1
0.1
I_OUT = 50 mA
V
3.0
− 0.36
0.44
4.5
− 0.36
0.44
5.5
− 0.36
0.44
*V_IN = V_IL or V_IH
V
I_OL
12 mA
24 mA
24 mA
I_IN
Maximum Input
Leakage Current
5.5
− ±0.1
±1.0
mA
V_I = V_CC, GND
I_OLD
I_OHD
†Minimum Dynamic
Output Current
5.5
−
−
75
5.5
−
−
−75
mA
V_OLD = 1.65 V Max
mA
V_OHD = 3.85 V Min
I_CC
Maximum Quiescent
Supply Current
5.5
−
8.0
80
mA
V_IN = V_CC or GND
*All outputs loaded; thresholds on input associated with output under test.
†Maximum test duration 2.0 ms, one output loaded at a time.
NOTE: I_IN and I_CC @ 3.0 V are guaranteed to be less than or equal to the respective limit @ 5.5 V V_CC.
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