CAT5140_13 Datasheet, PDF (4/10 Pages) ON Semiconductor – Single Channel 256 Tap Digital Potentiometer (POT)

CAT5140
Table 7. CAPACITANCE (T_A = 25C, f = 1.0 MHz, V_CC = 5 V)
Test
Test Conditions
Input/Output Capacitance (SDA)
Input Capacitance (SCL, WP)
V_I/O = 0 V
V_IN = 0 V
Symbol
C_I/O (Note 9)
C_IN (Note 9)
Max
8
6
Table 8. POWER UP TIMING (Notes 9 and 10)
Parameter
Symbol
Max
Power-up to Read Operation
t_PUR
1
Power-up to Write Operation
t_PUW
1
9. This parameter is tested initially and after a design or process change that affects the parameter.
10. t_PUR and t_PUW are delays required from the time V_CC is stable until the specified operation can be initiated.
Table 9. DIGITAL POT TIMING
Parameter
Symbol
Min
Max
Wiper Response Time After Power Supply Stable
t_WRPO
50
Wiper Response Time: SCL falling edge after last bit of wiper position data
t_WR
20
byte to wiper change
Units
pF
pF
Units
ms
ms
Units
ms
ms
Table 10. ENDURANCE
Parameter
Endurance
Data Retention
Reference Test Method
MIL−STD−883, Test Method 1033
MIL−STD−883, Test Method 1008
Symbol
N_END
T_DR
Min
2,000,000
100
Max
Units
Cycles
Years
Table 11. A.C. CHARACTERISTICS (V_CC = +2.5 V to +5.5 V, −40_C to +85_C unless otherwise specified.)
Parameter
Symbol
Min
Typ
Clock Frequency
Clock High Period
Clock Low Period
Start Condition Setup Time (for a Repeated Start Condition)
Start Condition Hold Time
Data in Setup Time
Data in Hold Time
Stop Condition Setup Time
Time the bus must be free before a new transmission can start
WP Setup Time
WP Hold Time
SDA and SCL Rise Time
SDA and SCL Fall Time
Data Out Hold Time
Noise Suppression Time Constant at SCL, SDA Inputs
SLC Low to SDA Data Out and ACK Out
Non-Volatile Write Cycle Time
f_SCL
t_HIGH
600
t_LOW
1300
t_SU:STA
600
t_HD:STA
600
t_SU:DAT
100
t_HD:DAT
0
t_SU:STO
600
t_BUF
1300
t_SU:WP
0
t_HD:WP
2.5
t_R
t_F
t_DH
100
T_I
t_AA
t_WR
4
Max Units
400
kHz
ns
ns
ns
ns
ns
ns
ns
ns
ms
ms
300
ns
300
ns
ns
50
ns
1
ms
10
ms
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