CAT24C32_15 Datasheet, PDF (4/16 Pages) ON Semiconductor – 32-Kb I2C CMOS Serial EEPROM

CAT24C32
Table 5. A.C. CHARACTERISTICS
(V_CC = 1.8 V to 5.5 V, T_A = −40°C to +125°C and V_CC = 1.7 V to 5.5 V, T_A = −40°C to +85°C.) (Note 6)
Symbol
F_SCL
t_HD:STA
t_LOW
t_HIGH
t_SU:STA
t_HD:DAT
t_SU:DAT
t_R (Note 7)
t_F (Note 7)
t_SU:STO
t_BUF
Parameter
Clock Frequency
START Condition Hold Time
Low Period of SCL Clock
High Period of SCL Clock
START Condition Setup Time
Data In Hold Time
Data In Setup Time
SDA and SCL Rise Time
SDA and SCL Fall Time
STOP Condition Setup Time
Bus Free Time Between STOP
and START
Standard
V_CC = 1.7 V − 5.5 V
Min
Max
100
4
4.7
4
4.7
0
250
1,000
300
4
4.7
Fast
V_CC = 1.7 V − 5.5 V
Min
Max
400
0.6
1.3
0.6
0.6
0
100
300
300
0.6
1.3
Fast−Plus (Note 9)
V_CC = 2.5 V − 5.5 V
T_A = −405C to +855C
Min
Max
1,000
0.25
0.45
0.40
0.25
0
50
100
100
0.25
0.5
Units
kHz
ms
ms
ms
ms
ms
ns
ns
ns
ms
ms
t_AA
SCL Low to Data Out Valid
3.5
0.9
0.40
ms
t_DH (Note 7) Data Out Hold Time
100
100
50
ns
T_i (Note 7)
Noise Pulse Filtered at SCL and
100
100
SDA Inputs
100
ns
t_SU:WP
WP Setup Time
0
0
0
ms
t_HD:WP
WP Hold Time
2.5
2.5
1
ms
t_WR
Write Cycle Time
5
5
5
ms
t_PU (Notes 7, 8) Power−up to Ready Mode
1
1
1
ms
6. Test conditions according to “A.C. Test Conditions” table.
7. Tested initially and after a design or process change that affects this parameter.
8. t_PU is the delay between the time V_CC is stable and the device is ready to accept commands.
9. Fast−Plus (1 MHz) speed class available for product revision “F”. The die revision “F” is identified by letter “F” or a dedicated marking code
on top of the package.
Table 6. A.C. TEST CONDITIONS
Input Drive Levels
Input Rise and Fall Time
0.2 x V_CC to 0.8 x V_CC
≤ 50 ns
Input Reference Levels
Output Reference Level
Output Test Load
0.3 x V_CC, 0.7 x V_CC
0.5 x V_CC
Current Source I_OL = 3 mA (V_CC ≥ 2.5 V); I_OL = 1 mA (V_CC < 2.5 V); C_L = 100 pF
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