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MC74VHCT139A Datasheet, PDF (3/7 Pages) ON Semiconductor – Dual 2−to−4 Decoder/ Demultiplexer
MC74VHCT139A
MAXIMUM RATINGS (Note 1)
Symbol
Parameter
Value
Unit
VCC
VIN
VOUT
IIK
IOK
IOUT
ICC
PD
Positive DC Supply Voltage
Digital Input Voltage
DC Output Voltage
Input Diode Current
Output Diode Current
DC Output Current, per Pin
DC Supply Current, VCC and GND Pins
Power Dissipation in Still Air
−0.5 to +7.0
V
−0.5 to +7.0
V
Output in 3−State
−0.5 to +7.0
V
High or Low State
−0.5 to VCC +0.5
−20
mA
$20
mA
$25
mA
$75
mA
SOIC Package
200
mW
TSSOP
180
TSTG
VESD
Storage Temperature Range
ESD Withstand Voltage
−65 to +150
°C
Human Body Model (Note 2)
>2000
V
Machine Model (Note 3)
>200
Charged Device Model (Note 4)
>2000
ILATCHUP Latchup Performance
Above VCC and Below GND at 125°C (Note 5)
$300
mA
qJA
Thermal Resistance, Junction−to−Ambient
SOIC Package
143
°C/W
TSSOP
164
Maximum ratings are those values beyond which device damage can occur. Maximum ratings applied to the device are individual stress limit
values (not normal operating conditions) and are not valid simultaneously. If these limits are exceeded, device functional operation is not implied,
damage may occur and reliability may be affected.
1. Maximum Ratings are those values beyond which damage to the device may occur. Functional operation should be restricted to the
Recommended Operating Conditions.
2. Tested to EIA/JESD22−A114−A
3. Tested to EIA/JESD22−A115−A
4. Tested to JESD22−C101−A
5. Tested to EIA/JESD78
RECOMMENDED OPERATING CONDITIONS
Symbol
Characteristics
VCC
VIN
VOUT
DC Supply Voltage
DC Input Voltage
DC Output Voltage Output in 3−State
High or Low State
TA
Operating Temperature Range, all Package Types
tr, tf
Input Rise or Fall Time
VCC = 5.0 V + 0.5 V
Min
Max
Unit
4.5
5.5
V
0
5.5
V
0
5.5
V
0
VCC
−55
125
°C
0
20
ns/V
DEVICE JUNCTION TEMPERATURE VERSUS TIME
TO 0.1% BOND FAILURES
Junction
Temperature °C
Time, Hours
Time, Years
80
1,032,200
117.8
90
419,300
47.9
100
178,700
20.4
110
79,600
9.4
120
37,000
4.2
130
17,800
2.0
140
8,900
1.0
FAILURE RATE OF PLASTIC = CERAMIC
UNTIL INTERMETALLICS OCCUR
1
1
10
100
1000
TIME, YEARS
Figure 6. Failure Rate vs. Time Junction Temperature
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