CAV25M01_15 Datasheet, PDF (3/14 Pages) ON Semiconductor – 1 Mb SPI Serial CMOS EEPROM

CAV25M01
Table 4. PIN CAPACITANCE (T_A = 25°C, f = 1.0 MHz, V_CC = +5.0 V) (Note 5)
Symbol
Test
Conditions
Min
Typ
Max Units
C_OUT
Output Capacitance (SO)
V_OUT = 0 V
8
pF
C_IN
Input Capacitance (CS, SCK, SI, WP, HOLD)
V_IN = 0 V
8
pF
5. These parameters are tested initially and after a design or process change that affects the parameter according to appropriate AEC−Q100
and JEDEC test methods.
Table 5. A.C. CHARACTERISTICS (T_A = −40°C to +125°C, unless otherwise specified.) (Note 6)
Symbol
Parameter
Min
Max
f_SCK
Clock Frequency
DC
10
t_SU
Data Setup Time
10
t_H
Data Hold Time
10
t_WH
SCK High Time
40
t_WL
SCK Low Time
40
t_LZ
HOLD to Output Low Z
25
t_RI (Note 8)
Input Rise Time
2
t_FI (Note 8)
Input Fall Time
2
t_HD
HOLD Setup Time
0
t_CD
HOLD Hold Time
10
t_V
Output Valid from Clock Low
40
t_HO
Output Hold Time
0
t_DIS
Output Disable Time
20
t_HZ
HOLD to Output High Z
25
t_CS
CS High Time
40
t_CSS
CS Setup Time
30
t_CSH
CS Hold Time
30
t_CNS
CS Inactive Setup Time
30
t_CNH
CS Inactive Hold Time
30
t_WPS
WP Setup Time
10
t_WPH
WP Hold Time
10
t_WC (Note 7) Write Cycle Time
5
6. AC Test Conditions:
Input Pulse Voltages: 0.3 V_CC to 0.7 V_CC
Input rise and fall times: ≤ 10 ns
Input and output reference voltages: 0.5 V_CC
Output load: current source I_{OL max}/I_{OH max}; C_L = 30 pF
7. t_WC is the time from the rising edge of CS after a valid write sequence to the end of the internal write cycle.
Units
MHz
ns
ns
ns
ns
ns
ms
ms
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ms
Table 6. POWER−UP TIMING (Notes 8 and 9)
Symbol
Parameter
Max
t_PUR
Power−up to Read Operation
1
t_PUW
Power−up to Write Operation
1
8. This parameter is tested initially and after a design or process change that affects the parameter.
9. t_PUR and t_PUW are the delays required from the time V_CC is stable until the specified operation can be initiated.
Units
ms
ms
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