CAT24C64BAC4 Datasheet, PDF (3/9 Pages) ON Semiconductor – 64 Kb I2C CMOS Serial EEPROM 4-ball WLCSP

CAT24C64BC4, CAT24C64BAC4
Table 5. A.C. CHARACTERISTICS (V_CC = 1.7 V to 5.5 V, T_A = −40°C to +85°C) (Note 5)
Standard
Fast
Symbol
Parameter
Min
Max
Min
Max
F_SCL
Clock Frequency
100
400
t_HD:STA
START Condition Hold Time
4
0.6
t_LOW
Low Period of SCL Clock
4.7
1.3
t_HIGH
High Period of SCL Clock
4
0.6
t_SU:STA
START Condition Setup Time
4.7
0.6
t_HD:DAT
Data In Hold Time
0
0
t_SU:DAT
Data In Setup Time
250
100
t_R (Note 6)
SDA and SCL Rise Time
1,000
300
t_F (Note 6)
SDA and SCL Fall Time
300
300
t_SU:STO
STOP Condition Setup Time
4
0.6
t_BUF
Bus Free Time Between
4.7
1.3
STOP and START
Fast−Plus
Min
Max
1,000
0.25
0.45
0.35
0.25
0
50
100
100
0.25
0.5
Units
kHz
ms
ms
ms
ms
ms
ns
ns
ns
ms
ms
t_AA
SCL Low to Data Out Valid
3.5
0.9
t_DH (Note 6)
Data Out Hold Time
100
100
T_i (Note 6)
Noise Pulse Filtered at SCL
50
50
and SDA Inputs
0.40
ms
50
ns
50
ns
t_WR
Write Cycle Time
4
4
4
ms
t_PU (Notes 6, 7) Power−up to Ready Mode
0.35
0.35
0.35
ms
Product parametric performance is indicated in the Electrical Characteristics for the listed test conditions, unless otherwise noted. Product
performance may not be indicated by the Electrical Characteristics if operated under different conditions.
5. Test conditions according to “A.C. Test Conditions” table.
6. Tested initially and after a design or process change that affects this parameter.
7. t_PU is the delay between the time V_CC is stable and the device is ready to accept commands.
Table 6. A.C. TEST CONDITIONS
Input Levels
V_CC ≥ 2.2 V: 0.2 x V_CC to 0.8 x V_CC
V_CC < 2.2 V: 0.15 x V_CC to 0.85 x V_CC
Input Rise and Fall Times
≤ 50 ns
Input Reference Levels
Output Reference Levels
Output Load
0.3 x V_CC, 0.7 x V_CC
0.3 x V_CC, 0.7 x V_CC
Current Source: I_OL = 3 mA (V_CC ≥ 2.2 V); I_OL = 1 mA (V_CC < 2.2 V); C_L = 100 pF
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