MC74LVX573 Datasheet, PDF (2/8 Pages) Motorola, Inc – LOW-VOLTAGE CMOS

MC74LVX573
1
OE
11
LE
2
D0
3
D1
4
D2
5
D3
6
D4
7
D5
8
D6
nLE
Q
D
nLE
Q
D
nLE
Q
D
nLE
Q
D
nLE
Q
D
nLE
Q
D
nLE
Q
D
19
O0
18
O1
17
O2
16
O3
15
O4
14
O5
13
O6
Table 1. PIN NAMES
Pins
Function
OE
LE
D0−D7
O0−O7
Output Enable Input
Latch Enable Input
Data Inputs
3−State Latch Outputs
INPUTS
OUTPUTS
OE LE Dn
On
OPERATING MODE
L HH
LHL
H
Transparent (Latch
L
Disabled); Read Latch
L
L
h
L
L
l
H
Latched (Latch Enabled)
L
Read Latch
L
L
X
NC
Hold; Read Latch
H
L
X
Z
Hold; Disabled Outputs
HHH
HH L
Z
Transparent (Latch
Z
Disabled); Disabled Outputs
H
L
h
H
L
l
Z
Latched (Latch Enabled);
Z
Disabled Outputs
H = High Voltage Level; h = High Voltage Level One Setup Time
Prior to the Latch Enable High−to−Low Transition; L = Low
Voltage Level; l = Low Voltage Level One Setup Time Prior to the
Latch Enable High−to−Low Transition; NC = No Change, State
Prior to the Latch Enable High−to−Low Transition; X = High or
Low Voltage Level or Transitions are Acceptable; Z = High
Impedance State; For I_CC Reasons DO NOT FLOAT Inputs.
9
D7
nLE
Q
D
12
O7
Figure 2. Logic Diagram
ÎÎÎÎÎÎÎÎÎÎÎÎÎÎÎÎÎÎÎÎÎÎÎÎÎÎÎÎÎÎÎÎÎ _{MAXIMUM RATINGS}
ÎÎÎÎÎÎÎÎÎÎÎÎÎÎÎÎÎÎÎÎÎÎÎÎÎÎÎÎÎÎÎÎÎ _Symbol
Parameter
Value
Unit
ÎÎÎÎÎÎÎÎÎÎÎÎÎÎÎÎÎÎÎÎÎÎÎÎÎÎÎÎÎÎÎÎÎ _{VCC DCSupplyVoltage}
–0.5 to +7.0
V
ÎÎÎÎÎÎÎÎÎÎÎÎÎÎÎÎÎÎÎÎÎÎÎÎÎÎÎÎÎÎÎÎÎ _Vin
DC Input Voltage
–0.5 to +7.0
V
ÎÎÎÎÎÎÎÎÎÎÎÎÎÎÎÎÎÎÎÎÎÎÎÎÎÎÎÎÎÎÎÎÎ _{Vout DCOutputVoltage}
–0.5 to V_CC +0.5
V
ÎÎÎÎÎÎÎÎÎÎÎÎÎÎÎÎÎÎÎÎÎÎÎÎÎÎÎÎÎÎÎÎÎ _IIK
Input Diode Current
−20
mA
ÎÎÎÎÎÎÎÎÎÎÎÎÎÎÎÎÎÎÎÎÎÎÎÎÎÎÎÎÎÎÎÎÎ _{IOK OutputDiodeCurrent}
±20
mA
ÎÎÎÎÎÎÎÎÎÎÎÎÎÎÎÎÎÎÎÎÎÎÎÎÎÎÎÎÎÎÎÎÎ _{Iout DC Output Current, per Pin}
±25
mA
ÎÎÎÎÎÎÎÎÎÎÎÎÎÎÎÎÎÎÎÎÎÎÎÎÎÎÎÎÎÎÎÎÎ _{ICC DC Supply Current, VCC and GND Pins}
±75
mA
ÎÎÎÎÎÎÎÎÎÎÎÎÎÎÎÎÎÎÎÎÎÎÎÎÎÎÎÎÎÎÎÎÎ _{PD PowerDissipation}
180
mW
ÎÎÎÎÎÎÎÎÎÎÎÎÎÎÎÎÎÎÎÎÎÎÎÎÎÎÎÎÎÎÎÎÎ _{Tstg Storage Temperature}
–65 to +150
°C
ÎÎÎÎÎÎÎÎÎÎÎÎÎÎÎÎÎÎÎÎÎÎÎÎÎÎÎÎÎÎÎÎÎ _{Maximum ratings are those values beyond which device damage can occur. Maximum ratings applied to the device are individual stress limit}
values (not normal operating conditions) and are not valid simultaneously. If these limits are exceeded, device functional operation is not implied,
damage may occur and reliability may be affected.
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