MC74HC73A_16 Datasheet, PDF (2/7 Pages) ON Semiconductor – Dual J-K Flip-Flop with Reset

MC74HC73A
MAXIMUM RATINGS
Symbol
Parameter
V_CC DC Supply Voltage (Referenced to GND)
V_in DC Input Voltage (Referenced to GND)
V_out DC Output Voltage (Referenced to GND)
I_in
DC Input Current, per Pin
I_out DC Output Current, per Pin
I_CC DC Supply Current, V_CC and GND Pins
P_D Power Dissipation in Still Air
SOIC Package†
T_stg Storage Temperature
T_L Lead Temperature, 1 mm from Case for 10 Seconds
(PSOIC Package)
Value
– 0.5 to + 7.0
– 1.5 to V_CC + 1.5
– 0.5 to V_CC + 0.5
± 20
± 25
± 50
500
– 65 to + 150
260
Unit
V
V
V
mA
mA
mA
mW
_C
_C
This device contains protection
circuitry to guard against damage
due to high static voltages or electric
fields. However, precautions must
be taken to avoid applications of any
voltage higher than maximum rated
voltages to this high−impedance cir-
cuit. For proper operation, V_in and
V_out should be constrained to the
range GND v (V_in or V_out) v V_CC.
Unused inputs must always be
tied to an appropriate logic voltage
level (e.g., either GND or V_CC).
Unused outputs must be left open.
Stresses exceeding those listed in the Maximum Ratings table may damage the device. If any of
these limits are exceeded, device functionality should not be assumed, damage may occur and
reliability may be affected.
†Derating — SOIC Package: – 7 mW/_C from 65_ to 125_C
RECOMMENDED OPERATING CONDITIONS
Symbol
Parameter
Min Max Unit
V_CC DC Supply Voltage (Referenced to GND)
2.0 6.0 V
V_in, V_out DC Input Voltage, Output Voltage (Referenced to GND)
0
V_CC
V
T_A
Operating Temperature, All Package Types
– 55 + 125 _C
t_r, t_f
Input Rise and Fall Time
(Figure 1)
V_CC = 2.0 V 0
V_CC = 4.5 V 0
V_CC = 6.0 V 0
1000 ns
500
400
Functional operation above the stresses listed in the Recommended Operating Ranges is not
implied. Extended exposure to stresses beyond the Recommended Operating Ranges limits may
affect device reliability.
DC ELECTRICAL CHARACTERISTICS (Voltages Referenced to GND)
Symbol
V_IH
Parameter
Minimum High−Level Input
Voltage
Test Conditions
V_out = 0.1 V or V_CC – 0.1 V
|I_out| v 20 μA
Guaranteed Limit
V_CC
– 55 to
V
25_C v 85_C v 125_C _Unit
2.0
1.5
1.5
1.5
V
4.5
3.15
3.15
3.15
6.0
4.2
4.2
4.2
V_IL
Maximum Low−Level Input
Voltage
V_out = 0.1 V or V_CC – 0.1 V
|I_out| v 20 μA
2.0
0.3
0.3
0.3
V
4.5
0.9
0.9
0.9
6.0
1.2
1.2
1.2
V_OH
Minimum High−Level Output
Voltage
V_in = V_IH or V_IL
|I_out| v 20 μA
2.0
1.9
1.9
1.9
V
4.5
4.4
4.4
4.4
6.0
5.9
5.9
5.9
V_in = V_IH or V_IL |I_out| v 4.0 mA 4.5
|I_out| v 5.2 mA 6.0
3.98
5.48
3.84
5.34
3.70
5.20
V_OL
Maximum Low−Level Output
Voltage
V_in = V_IH or V_IL
|I_out| v 20 μA
2.0
0.1
0.1
0.1
V
4.5
0.1
0.1
0.1
6.0
0.1
0.1
0.1
V_in = V_IH or V_IL |I_out| v 4.0 mA 4.5
|I_out| v 5.2 mA 6.0
0.26
0.26
0.33
0.33
0.40
0.40
I_in
Maximum Input Leakage Current V_in = V_CC or GND
6.0
± 0.1
± 1.0
± 1.0
μA
I_CC
Maximum Quiescent Supply
Current (per Package)
V_in = V_CC or GND
I_out = 0 μA
6.0
4
40
80
μA
Product parametric performance is indicated in the Electrical Characteristics for the listed test conditions, unless otherwise noted. Product
performance may not be indicated by the Electrical Characteristics if operated under different conditions.
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