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CAT25010_12 Datasheet, PDF (2/18 Pages) ON Semiconductor – 1-Kb, 2-Kb and 4-Kb SPI Serial CMOS EEPROM
CAT25010, CAT25020, CAT25040
Table 1. ABSOLUTE MAXIMUM RATINGS
Parameters
Ratings
Units
Operating Temperature
−45 to +130
°C
Storage Temperature
−65 to +150
°C
Voltage on any Pin with Respect to Ground (Note 1)
−0.5 to VCC + 0.5
V
Stresses exceeding Maximum Ratings may damage the device. Maximum Ratings are stress ratings only. Functional operation above the
Recommended Operating Conditions is not implied. Extended exposure to stresses above the Recommended Operating Conditions may affect
device reliability.
Table 2. RELIABILITY CHARACTERISTICS (Note 2)
Symbol
Parameter
NEND (Note 3)
TDR
Endurance
Data Retention
Min
1,000,000
100
Units
Program / Erase Cycles
Years
Table 3. D.C. OPERATING CHARACTERISTICS
(VCC = 1.8 V to 5.5 V, TA = −40°C to +85°C and VCC = 2.5 V to 5.5 V, TA = −40°C to +125°C, unless otherwise specified.)
Symbol
Parameter
Test Conditions
Min
Max
ICC
Supply Current
Read, Write, VCC = 5.0 V,
10 MHz / −40°C to 85°C
2
SO open
5 MHz / −40°C to 125°C
2
ISB1
ISB2
IL
ILO
VIL
VIH
VOL1
VOH1
VOL2
VOH2
Standby Current
Standby Current
VIN = GND or VCC, CS = VCC,
WP = VCC, VCC = 5.0 V
VIN = GND or VCC, CS = VCC,
WP = GND, VCC = 5.0 V
Input Leakage Current
Output Leakage
Current
VIN = GND or VCC
CS = VCC,
VOUT = GND or VCC
Input Low Voltage
Input High Voltage
Output Low Voltage
Output High Voltage
Output Low Voltage
Output High Voltage
VCC > 2.5 V, IOL = 3.0 mA
VCC > 2.5 V, IOH = −1.6 mA
VCC > 1.8 V, IOL = 150 mA
VCC > 1.8 V, IOH = −100 mA
TA = −40°C to +85°C
TA = −40°C to +125°C
TA = −40°C to +85°C
TA = −40°C to +125°C
2
−2
−1
−1
−0.5
0.7 VCC
VCC − 0.8 V
VCC − 0.2 V
4
5
2
1
2
0.3 VCC
VCC + 0.5
0.4
0.2
Units
mA
mA
mA
mA
mA
mA
mA
mA
V
V
V
V
V
V
Table 4. PIN CAPACITANCE (Note 2) (TA = 25°C, f = 1.0 MHz, VCC = +5.0 V)
Symbol
Test
Conditions
Min
Typ
Max
Units
COUT
Output Capacitance (SO)
VOUT = 0 V
8
pF
CIN
Input Capacitance (CS, SCK, SI, WP, HOLD)
VIN = 0 V
8
pF
1. The DC input voltage on any pin should not be lower than −0.5 V or higher than VCC + 0.5 V. During transitions, the voltage on any pin may
undershoot to no less than −1.5 V or overshoot to no more than VCC + 1.5 V, for periods of less than 20 ns.
2. These parameters are tested initially and after a design or process change that affects the parameter according to appropriate AEC−Q100
and JEDEC test methods.
3. Page Mode, VCC = 5 V, 25°C.
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