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AND8048 Datasheet, PDF (2/8 Pages) ON Semiconductor – Dual P-Channel 1.8 V (G-S) MOSFET
AND8048/D
MODEL EVALUATION
P–CHANNEL DEVICE (TJ = 25°C unless otherwise noted)
Characteristic
Symbol
Static
Gate Threshold Voltage
On–State Drain Current (Note 1.)
Drain–Source On–State Resistance (Note 1.)
VGS(th)
ID(on)
rDS(on)
Forward Transconductance (Note 1.)
Diode Forward Voltage (Note 1.)
Dynamic (Note 2.)
Total Gate Charge
Gate–Source Charge
Gate–Drain Charge
Turn–On Delay Time
Rise Time
Turn–Off Delay Time
Fall Time
Source–Drain Reverse Recovery Time
1. Pulse test: pulse width  300 ms, duty cycle  2%.
2. Guaranteed by design, not subject to production testing.
gfs
VSD
Qg
Qgs
Qgd
td(on)
tr
td(off)
tf
trr
Test Conditions
VDS = VGS, ID = –250 mA
VDS  –5.0 V, VGS = 4.5 V
VGS = –4.5 V, ID = –3.0 A
VGS = –2.5 V, ID = –2.5 A
VGS = –1.8 V, ID = –1.0 A
VDS = 5.0 V, ID = 3.0 A
IS = –0.9 A, VGS = 0.0 V
VDS = –4.0 V, VGS = –4.5 V, ID = –3.0 A
VDD = –4.0 V, RL = 4.0 W, ID ^ –1.0 A,
VGEN = –4.5 V, RG = 6.0 W
IF = –0.9 A, di/dt = 100 A/ms
Typical Unit
0.83
V
36
A
0.080
0.110
W
0.142
7.6
S
–0.80
V
35
0.5
nC
1.5
13
19
24
ns
12
28
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