KAI-1010 Datasheet, PDF (12/27 Pages) List of Unclassifed Manufacturers – Image Sensor

KAI−1010
DEFECT DEFINITIONS
All values are derived under normal operating conditions at 40°C operating temperature.
Table 8. DEFECT DEFINITIONS
Defect Type
Defect Definition
Number Allowed
Defective Pixel Under uniform illumination with mean pixel output at 80% of V_SAT,
12
a defective pixel deviates by more than 15% from the mean value of
all pixels in its section.
Bright Defect
Under dark field conditions, a bright defect deviates more than 15 mV
5
from the mean value of all pixels in its section.
Cluster Defect
Two or more vertically or horizontally adjacent defective pixels.
0
1. Sections are 252 (H) × 255 (V) pixel groups, which divide the imager into sixteen equal areas as shown below.
Notes
1
1
1,1
1,255
1,510
1,765
1,1018
1008,1
1008,255
1008,510
1008,765
1008,1018
Table 9.
Test Conditions
Junction Temperature
Integration Time
Readout Rate
Figure 11.
Value
(T_J) = 40°C
(t_INT) = 70 ms
(t_READOUT) = 70 ms
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