KAF-1603 Datasheet, PDF (10/21 Pages) ON Semiconductor – FULL FRAME CCD IMAGE SENSOR

KAF-1603 Image Sensor
Imaging Performance
TYPICAL OPERATIONAL CONDITIONS
All values measured at 25 °C, and nominal operating conditions. These parameters exclude defective pixels.
SPECIFICATIONS
Description
Saturation Signal
Vertical CCD capacity
Horizontal CCD capacity
Output Node capacity
Quantum Efficiency (microlens)
Quantum Efficiency (no microlens)
Photoresponse Non-Linearity
Photoresponse Non-Uniformity
Dark Signal
Dark Signal Doubling Temperature
Dark Signal Non-Uniformity
Dynamic Range
Charge Transfer Efficiency
Output Amplifier DC Offset
Output Amplifier Sensitivity
Output Amplifier Output Impedance
Noise Floor
Symbol
Nsat
PRNL
PRNU
Jdark
DSNU
DR
CTE
Vodc
Vout/Ne^-
Zout
ne^-
Min.
Nom.
Max
85000
170000
190000
72
0.99997
Vrd
9
180
100000
200000
220000
1.0
0.8
10
2
6.3
10
74
0.99999
Vrd + 0.5
10
200
15
240000
77%
65%
2.0
50
10
7
50
Vrd + 1.0
220
20
Units
Notes
electrons/pixel
1
%QE
%
2
%
3
electrons/pixel/sec
pA/cm²
4
°C
electrons/pixel/sec
5
DB
6
V
µV/e^-
Ohms
electrons
7
Verification
Plan
design⁹
design⁹
design⁹
die⁸
die⁸
design⁹
die⁸
design⁹
die⁸
die⁸
design⁹
design⁹
die⁸
Notes:
1.
2.
3.
4.
5.
6.
7.
8.
9.
For pixel binning applications, electron capacity up to 330000 can be achieved with modified CCD inputs. Each sensor may
have to be optimized individually for these applications. Some performance parameters may be compromised to achieve
the largest signals.
Worst-case deviation from straight line fit, between 2% and 90% of Vsat.
One Sigma deviation of a 128 x 128 sample when CCD illuminated uniformly at half of saturation.
Average of all pixels with no illumination at 25 °C
Average dark signal of any of 11 x 8 blocks within the sensor (each block is 128 x 128 pixels).
20log (Nsat / ne^-) at nominal operating frequency and 25 °C.
Noise floor is specified at the nominal pixel frequency and excludes any dark or pattern noises. It is dominated by the
output amplifier power spectrum with a bandwidth = 5 * pixel rate.
A parameter that is measured on every sensor during production testing.
A parameter that is quantified during the design verification activity.
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Revision 1.1 PS-0036 Pg 10