CM1241_11 Datasheet, PDF (1/7 Pages) ON Semiconductor – 4-Channel Low Capacitance Dual-Voltage ESD Protection Array

CM1241
4-Channel Low Capacitance
Dual-Voltage ESD Protection
Array
Features
• 3 Channels of Low Voltage ESD Protection
• 1 Channel of High Voltage ESD Protection
• Provides ESD Protection to IEC61000−4−2 Level 4:
±8 kV Contact Discharge (Pins 1−3)
±15 kV Contact Discharge (Pin 4)
• Low Channel Input Capacitance
• Minimal Capacitance Change with Temperature and Voltage
• High Voltage Zener Diode Protects Supply Rail
• No Need for External Bypass Capacitors
• Each I/O Pin Can Withstand Over 1000 ESD Strikes*
• These Devices are Pb−Free and are RoHS Compliant
TYPICAL APPLICATION
http://onsemi.com
8
1
WDFN−8
D4 SUFFIX
CASE 511BF
BLOCK DIAGRAM
V_P (Internal)
V_CC
Pin 4
CH1
CH2
CH3
Pin 1
Pin 2
Pin 3
Pins 6 − 8
V_N
Pin 5
GND
MARKING DIAGRAM
AW1 MG
G
AW1 = Specific Device Code
M
= Date Code
G
= Pb−Free Package
(Note: Microdot may be in either location)
ORDERING INFORMATION
Device
CM1241−04D4
Package
WDFN−8
(Pb−Free)
Shipping^†
3000/Tape & Reel
†For information on tape and reel specifications,
including part orientation and tape sizes, please
refer to our Tape and Reel Packaging Specification
Brochure, BRD8011/D.
*Standard test condition is IEC61000−4−2 level 4 test circuit with each pin subjected to ±8 kV contact discharge for 1000 pulses. Discharges
are timed at 1 second intervals and all 1000 strikes are completed in one continuous test run. The part is then subjected to standard production
test to verify that all of the tested parameters are within spec after the 1000 strikes.
© Semiconductor Components Industries, LLC, 2011
1
February, 2011 − Rev. 4
Publication Order Number:
CM1241/D