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| 74HC2G126 Datasheet, PDF (8/14 Pages) NXP Semiconductors – Dual buffer/line driver; 3-state | |||
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NXP Semiconductors
74HC2G126; 74HCT2G126
Dual buffer/line driver; 3-state
VI 90 %
tW
negative
pulse
VM
10 %
0V
tf
VI
positive
pulse
tr
90 %
VM
10 %
0V
tW
VM
tr
tf
VM
VI
G
VCC
VO
DUT
RT
VCC
RL S1
CL
open
001aad983
Fig 8.
Test data is given in Table 10.
Deï¬nitions test circuit:
RT = Termination resistance should be equal to output impedance Zo of the pulse generator.
CL = Load capacitance including jig and probe capacitance.
RL = Load resistance.
S1 = Test selection switch.
Test circuit for measuring switching times
Table 10. Test data
Type
Input
74HC2G126
74HCT2G126
VI
GND to VCC
GND to 3 V
tr, tf
⤠6 ns
⤠6 ns
Load
CL
15 pF, 50 pF
15 pF, 50 pF
RL
1 kâ¦
1 kâ¦
S1 position
tPHL, tPLH
open
open
tPZH, tPHZ
GND
GND
tPZL, tPLZ
VCC
VCC
74HC_HCT2G126_4
Product data sheet
Rev. 04 â 24 September 2009
© NXP B.V. 2009. All rights reserved.
8 of 14
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