74ALVC32 Datasheet, PDF (7/13 Pages) Fairchild Semiconductor – Low Voltage Quad 2-Input OR Gate with 3.6V Tolerant Inputs and Outputs

NXP Semiconductors
74ALVC32
Quad 2-input OR gate
V_{I 90 %}
t_W
negative
pulse
V_M
10 %
0V
t_f
V_I
positive
pulse
t_r
90 %
V_M
10 %
0V
t_W
V_M
t_r
t_f
V_M
V_I
G
V_CC
V_O
DUT
V_EXT
RL
RT
CL
RL
001aae331
Test data is given in Table 9.
Definitions for test circuit:
R_L = Load resistance.
C_L = Load capacitance including jig and probe capacitance.
R_T = Termination resistance should be equal to output impedance Z_o of the pulse generator.
V_EXT = External voltage for measuring switching times.
Fig 7. Test circuitry for switching times
Table 9. Test data
Supply voltage V_CC
1.65 V to 1.95 V
2.3 V to 2.7 V
2.7 V
3.0 V to 3.6 V
Input
V_I
V_CC
V_CC
2.7 V
2.7 V
t_r, t_f
≤ 2.0 ns
≤ 2.0 ns
≤ 2.5 ns
≤ 2.5 ns
Load
C_L
30 pF
30 pF
50 pF
50 pF
R_L
1 kΩ
500 Ω
500 Ω
500 Ω
V_EXT
t_PLH, t_PHL
open
open
open
open
t_PLZ, t_PZL
2 × V_CC
2 × V_CC
6V
6V
t_PHZ, t_PZH
GND
GND
GND
GND
74ALVC32_2
Product data sheet
Rev. 02 — 10 December 2007
© NXP B.V. 2007. All rights reserved.
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