PMLL4148L_11 Datasheet, PDF (5/11 Pages) NXP Semiconductors – High-speed switching diodes

NXP Semiconductors
PMLL4148L; PMLL4448
High-speed switching diodes
1.2
C_d
(pF)
1.0
mgd004
0.8
0.6
0.4
0
10
V_R (V)
20
f = 1 MHz; T_j = 25 °C
Fig 5. Diode capacitance as a function of reverse voltage; typical values
8. Test information
R_S = 50 Ω
V = V_R + I_F × R_S
D.U.T.
I_F
SAMPLING
OSCILLOSCOPE
R_i = 50 Ω
V_R
mga881
t_r
t_p
10 %
90 %
input signal
t
+ I_F
trr
t
(1)
output signal
(1) I_R = 1 mA
Input signal: reverse pulse rise time t_r = 0.6 ns; reverse voltage pulse duration t_p = 100 ns; duty cycle δ ≤ 0.05
Oscilloscope: rise time t_r = 0.35 ns
Fig 6. Reverse recovery time test circuit and waveforms
I
1 kΩ
450 Ω
R_S = 50 Ω
D.U.T.
OSCILLOSCOPE
R_i = 50 Ω
I
90 %
10 %
t_r
t_p
input signal
V
VFR
t
t
output signal
mga882
Input signal: forward pulse rise time t_r = 20 ns; forward current pulse duration t_p ≥ 100 ns; duty cycle δ ≤ 0.005
Fig 7. Forward recovery voltage test circuit and waveforms
PMLL4148L_PMLL4448
Product data sheet
All information provided in this document is subject to legal disclaimers.
Rev. 8 — 1 February 2011
© NXP B.V. 2011. All rights reserved.
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