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Z0103NN_11 Datasheet, PDF (3/15 Pages) NXP Semiconductors – Logic level four-quadrant triac
NXP Semiconductors
Z0103NN
4Q Triac
4. Limiting values
Table 4. Limiting values
In accordance with the Absolute Maximum Rating System (IEC 60134).
Symbol
Parameter
Conditions
VDRM
IT(RMS)
repetitive peak off-state voltage
RMS on-state current
full sine wave; Tsp ≤ 105 °C;
see Figure 3; see Figure 1; see Figure 2
ITSM
non-repetitive peak on-state
full sine wave; Tj(init) = 25 °C; tp = 20 ms;
current
see Figure 4; see Figure 5
I2t
dIT/dt
I2t for fusing
rate of rise of on-state current
full sine wave; Tj(init) = 25 °C;
tp = 16.7 ms
tp = 10 ms; sine-wave pulse
IT = 1 A; IG = 20 mA; dIG/dt = 0.1 A/µs;
T2+ G+
IT = 1 A; IG = 20 mA; dIG/dt = 0.1 A/µs;
T2+ G-
IT = 1 A; IG = 20 mA; dIG/dt = 0.1 A/µs;
T2- G-
IT = 1 A; IG = 20 mA; dIG/dt = 0.1 A/µs;
T2- G+
IGM
PGM
PG(AV)
Tstg
Tj
peak gate current
peak gate power
average gate power
storage temperature
junction temperature
over any 20 ms period
Min Max Unit
-
800 V
-
1
A
-
8
A
-
8.5 A
-
0.32 A2s
-
50 A/µs
-
50 A/µs
-
50 A/µs
-
20 A/µs
-
1
A
-
2
W
-
0.1 W
-40 150 °C
-
125 °C
8
IT(RMS)
(A)
6
4
2
003aac269
1.2
IT(RMS)
(A)
0.8
0.4
003aac270
010-2
10-1
1
10
surge duration (s)
0
-5 0
0
50
100
150
Ts p (°C)
Fig 1. RMS on-state current as a function of surge
duration; maximum values
Fig 2. RMS on-state current as a function of solder
point temperature; maximum values
Z0103NN
Product data sheet
All information provided in this document is subject to legal disclaimers.
Rev. 05 — 21 March 2011
© NXP B.V. 2011. All rights reserved.
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