TDA5051ATD-T Datasheet, PDF (20/29 Pages) NXP Semiconductors – Home automation modem

NXP Semiconductors
13. Test information
TDA5051A
Home automation modem
pulse
generator _G
300 Hz
50 %
DATA_IN ₁
DATA_OUT
2
TDA5051A
(to be tested)
TX_OUT ^{1 μF}
10
RX_IN ^{10 nF}
14
7
8
Y1
Y2
30 Ω
XTAL
OSCILLOSCOPE
f_osc
DATA_IN
TX_OUT/RX_IN
DATA_OUT
t_d(dem)(su)
t_d(dem)(h)
Fig 21. Test set-up for measuring demodulation delay
002aaf051
coupling network⁽³⁾
CISPR16 network⁽⁴⁾
OSC1
7
TX_OUT
10
TDA5051A
10 μF
33 nF
33 nF _{47 μH}
47 μH
250 nF
8
OSC2
1
12, 5, 9 ^{AGND, DGND, APGND}
13, 3, 11
DATA_IN ^{VDDA, VDDD, VDDAP}
50 μH
5Ω
50 Ω
(1) (2)
G
+5 V
POWER
SUPPLY
250 nF
50 μH
5Ω
SPECTRUM
ANALYZER
50 Ω
002aaf052
(1) Square wave TTL signal 300 Hz, duty factor = 50 % for measuring signal bandwidth
(see Figure 3).
(2) DATA_IN + LOW for measuring total harmonic distortion (see Figure 3).
(3) Tuned for f_cr = 132.5 kHz.
(4) The CISPR16 network provides a −6 dB attenuation.
Fig 22. Test set-up for measuring THD and bandwidth of the TX_OUT signal
TDA5051A
Product data sheet
All information provided in this document is subject to legal disclaimers.
Rev. 5 — 13 January 2011
© NXP B.V. 2011. All rights reserved.
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