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NTE21128 Datasheet, PDF (1/6 Pages) NTE Electronics – Integrated Circuit NMOS, 128K (16K x 8) UV EPROM
NTE21128
Integrated Circuit
NMOS, 128K (16K x 8) UV EPROM
Description:
The NTE21128 is a 131,072 bit UV erasable and electrically programmable memory EPROM in a
28–Lead DIP type package organized as 16,384 words by 8 bits. The transparent lid allows the user
to expose the chip to ultraviolet light to erase the bit pattern. A new pattern can then be written to the
device by following the programming procedure.
Features:
D Access Time: 250ns
D Single 5V Supply Voltage
D Low Standby Current: 40mA Max
D TTL Compatible During Read and Program
D Fast Programming Algorithm
D Programming Voltage: 12V Typ
Absolute Maximum Ratings:
Supply Voltage, VCC . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . –0.6V to 6.25V
Program Supply, VPP . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . –0.6V to 14V
A9 Voltage, VA9 . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . –0.6V to 13.5V
Input or Output Voltages, VIO . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . –0.6V to 6.25V
Ambient Operating Temperature, TA . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 0° to +70°C
Temperature Under Bias, TBIAS . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . –10° to +80°C
Storage Temperature Range, Tstg . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . –65° to +125°C
Note 1. Except for the rating “Operating Temperature Range”, stresses above those listed in the
table “Absolute Maximum Ratings” may cause permanent damage to the device. These are
stress ratings only and operation of the device at these or any other conditions above those
indicated in the Operating sections of this specification is not implied. Exposure to Absolute
Maximum Rating conditions for extended periods may affect device reliability.
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